179 | Agilent Technologies 16760A guide

Chapter 5: Reference

The Trigger Tab

maximum width specifications.

•Find Nth occurrence of an edge

Becomes true when the specified edge occurs in the specified number of samples.

•Find pattern present/absent for > duration

Becomes true when the specified pattern is present or absent for greater than the amount of time specified.

•Find pattern present/absent for < duration

Becomes true when the specified pattern is present or absent for less than the amount of time specified.

•Run until user stop

Sets up to never trigger. You must select the stop button to view the captured data.

•Find 2 edges too close together

Becomes true when the second specified edge occurs within a specified time after the first specified edge.

•Find 2 edges too far apart

Becomes true when the second specified edge does not occur within a specified time after the first specified edge.

•Find pattern occurring too soon after edge

Becomes true when a specified pattern occurs within a specified time after the first specified edge.

•Find pattern occurring too late after edge

Becomes true when a specified pattern does not occur within a specified time after the first specified edge.

•Find glitch

Becomes true when the specified glitch occurs in one sample.

•Wait t seconds

Becomes true when the specified amount of time has expired.

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Agilent Technologies 16760A manual 179

Contents

Agilent Technologies. All rights reserved Agilent Technologies 16760A Logic Analyzer Probing Captures input signals as low as 200 mV p-pSampling Mode on Agilent Technologies 16760A Logic Analyzer Concepts on Reference on Glossary see See Also Contents Choosing the Sampling Mode 114 Using Symbols 101110 112 Format Tab 174 Displaying Captured Eye Scan Data152 155 211 Eye Scan Tab 204210 259 Specifications and Characteristics240 Glossary Index Contents Getting Started Eye scan sampling mode, measurements will have these steps Connect logic analyzer to the device under test Probing and Sampling Mode Selection StepsNext . Choose the sampling mode on To choose the sampling mode Choose the sampling mode If you chose State Mode If you chose Timing Mode If you chose Eye Scan Mode Next . Format labels for the probed signals onEither Timing Mode or State Mode Format labels for the probed signals To specify threshold voltages To assign pods to the logic analyzer To assign names to logic analyzer channels NextDefined threshold voltage Select the Close button Define the trigger condition Timing Mode or State Mode Steps Next . Run the measurement on Run the measurement To open Waveform or Listing displays Display the captured dataNext . Display the captured data on To add display tools via the Workspace window Next For More Information... on Select channels for the eye scan measurement Eye Scan Mode Steps Next . Set the eye scan range and resolution on Set the eye scan range and resolution Next . Run the eye scan measurement on Run the eye scan measurement Next . Display the captured eye scan data on Display the captured eye scan data Eye Scan display window, use the following subtabs For More Information For More Information Probing and Selecting the Sampling Mode Probing and Selecting the Sampling Mode Probing the Device Under Test Using the E5378A Single-Ended Probe Either Single-ended signalNumber Numbers Using the E5379A Differential Probe Reference voltage Or single-ended signalsIndependent threshold adjustment Negative data inputs Or AMP Using the E5380A Mictor-Compatible Probe Using the E5382A Single-ended Flying Lead Probe Set Additional Accessories Using an Analysis Probe Probing the Device Under Test Selecting the Timing Mode Asynchronous Sampling Choosing the Sampling Mode To select the conventional/transitional configuration To select the timing mode Sample rate is the inverse of the sample period To specify the sample period To manually adjust sampling positions on Selecting the State Mode Synchronous SamplingState Mode Sampling Position To automatically adjust sampling positions on To select the state speed configuration To select the state mode For the clock input signal that will be used To set up the sampling clock Run simultaneously To automatically adjust sampling positionsAutomatically sets the sampling position To run eye finder repetitively Choose the labels that you wish to run eye finder on To save/load eye finder data To view eye finder data as a bus compositeTo view eye finder data as a stack of channels Eye finder data must be saved and loaded separately To manually adjust sampling positionsEye Finder Advanced Settings Dialog on To set acquisition memory depth Either Timing Mode or State ModeTo specify the trigger position You can also name analyzers in the Pod Assignment Dialog on To name an analyzerTo turn an analyzer off or on You can give more descriptive names to a logic analyzer High-speed or high-bandwidth oscilloscope Selecting the Eye Scan ModeTo select the eye scan mode To select the eye scan mode speed configuration To set up the eye scan mode reference clock To assign pods to the analyzer Format tab has activity indicators that show signal levelsFormatting Labels for Logic Analyzer Probes To set pod threshold voltages Capturing Data on 17 Channels in State ModeTo set up qualified eye scan measurements on To set clock threshold voltages To assign probe channels to labels To delete labels Maximum of 32 channels can be assigned to a labelLabel off Label SignalsTo import label names and assignments from a netlist E5378A and E5380A probe types to be selectable Label Definition File Format Examples To import label definitions from an Ascii fileTo assign label name Blue to channel 5 on pod A2 Channel 5 on pod A2, and channel 6 on pod A1 To export label definitions to an Ascii fileTo change the label polarity Changing the label polarity does not affect To reorder bits in a labelChanging the label polarity will have the following effects To display a label that was off To turn labels off or onTo turn a label off To turn a label on Using the Logic Analyzer in Timing or State Mode Using the Logic Analyzer in Timing or State Mode General Setting Up Triggers and Running MeasurementsUse trigger functions for basic measurements To select a trigger function Using Trigger Functions To specify a label pattern event Timing only To specify a label edge event To enter symbolic label values on Symbols Selector Dialog on To compress a trigger function To expand a trigger function To copy trigger function libraries between systems To load/unload trigger function libraries To count time, states, or turn counting off Using Other Trigger Features If you chose Custom To specify default storingTo assign pods to the analyzer on Reduced by half in order to store the required time tags To clear default storing changes Acquisition option button and choose either On or Off Default storing is initially on or offTrigger tabs Default Storing subtab, select the At start To insert a store action state mode on To replace sequence levels To insert/replace/delete sequence levelsTo clear the trigger sequence on To insert sequence levels To cut/copy-and-paste sequence levels Setting Up Triggers and Running Measurements Example system14 Slot C Analyzer C has triggered Trigger tab, select the Overview subtab To restore default trigger settingsTo view a picture of the trigger sequence To clear the trigger sequence To specify a time duration for events timing only To specify a duration or occurrence count for events Available To insert a store action state modeTo insert timer actions/events To insert a timer action To insert a counter event To insert a timer eventTo insert counter actions/events To insert a counter action To insert flag actions/events To insert a flag event To drive the Port Out signal with a flag To use named events To insert a reset occurrence counter actionTo group events To insert a named event Saving/Recalling Trigger SetupsTo save a trigger setup To give an event list a name To start/stop measurements To recall a trigger setupRunning Measurements To clear the trigger save/recall list Waiting for Trigger on If nothing happens when you start a measurementTo stop a measurement Select the Stop or Stop All button To view the trigger status To open Waveform or Listing displays Displaying Captured Data Search for particular data values captured on labels Help volumeTo use other display tools Windows Displaying Captured Data Into parallel words which are easier to view and analyze Analyzer help volumeIntermittent Data Errors Unwanted Triggers If the captured data doesnt look correct This situation will occur in these cases If there are filtered data holes in display memory To view symbolic values in a listing display To display symbols for data valuesTo view symbolic values in a waveform display 100 To cancel the display processing of captured dataSelect the Cancel button 101 Using SymbolsYou can use symbol names in place of data values when 102 To load object file symbolsTo reload object file symbols Object file symbols are reloaded To adjust symbol values for relocated code 104 To create user-defined symbolsWhose symbols you wish to relocate To replace user-defined symbols To load user-defined symbols To enter symbolic label valuesWhen entering label values in the trigger sequence To delete user-defined symbols 106 To create an Ascii symbol fileGeneral-Purpose Ascii GPA Symbol File Format on Create the reader.ini file on your workstation or PC Examples Example for Elf/Stabs StabsTypeReadOnlyTicoffPage AppendTicoffPage 109 Example for Coff/Stabs using Ticoff readerExample for Ticoff You can print captured data from display tool windows Printing/Exporting Captured Data 111 Select the file name and automatic file sequencing optionsSelect the Read File button Icon to view the imported data 112 Cross-TriggeringTo cross-trigger with another instrument 113 When the logic analyzer drives the arm signal 114 Solving Logic Analysis ProblemsTo test the logic analyzer hardware To test the logic analyzer hardware on 115 Service Center for assistanceSystem help volume 116 Saving and Loading Logic Analyzer ConfigurationsTo save logic analyzer configurations To load logic analyzer configurations 117 Using the Logic Analyzer in Eye Scan Mode 118 119 Setting Up and Running Eye Scan MeasurementsEye Scan tab lets you set up and run Eye Scan measurements To select channels for the eye scan 120 To set the eye scan range and resolutionScan Settings Subtab on 121 To quickly set up another measurement using the scale seeTo run an eye scan measurement To set advanced eye scan options 122 To set up qualified eye scan measurementsAdvanced Subtab on 123 Requirements Signal Timing Burst TransfersMemory device versus a memory controller Before the clock edge to after it Has adjustable sampling positions on each input channelBurst After the rising edge of the clock 125 Clock cycle of the next burstAre supported 126 127 Be sure that the thresholds are set correctly Display For correct state mode acquisitionsNot already expanded Start your target system and select Run Eye Finder 129 Now, set up eye scan mode 130 Select the Eye Scan tab Select the Qualifier subtab 131 Select the Qualify eye scan sampling using... button To comment on the eye scan settings 133 Displaying Captured Eye Scan DataTo open the Eye Scan display 134 To select the channels displayedTool Within the data captured on the bus Eye Scan display window, select the Scale tab To scale the Eye Scan displayScale tab, you can To use the scaling options To open the Eye Scan display on To quickly set up another measurement using the scaleTo set Eye Scan display options To clear the captured eye scan data 137 138 139 140 To change the Eye Scan color scale 141 Is zero by defaultMake measurements on the eye scan data on 142 To make measurements on the eye scan dataAbout the captured measurement data 143 144 145 146 147 148 149 To display information about the eye scan dataScroll bars to navigate through the information Eye Scan display window, select the Info tab 150 Info tab, you can 151 To comment on the eye scan data 152 Loading Logic Analyzer Configurations onSaving and Loading Captured Eye Scan Data 153 Sampling Tab on Format Tab on Trigger Tab on 154 155 Sampling TabSampling tab lets you choose between the logic analyzers 156 Timing ModeConventional Transitional Acquisition Samples with transitions How Samples are Stored in Transitional TimingWill be stored Period and other times more than two sample periods apart 158 State ModeState Speed 159 Sampling Positions Dialog 160 Sampling Positions TabFile menu Lets you save/load eye finder data 161 Label buttonsDisplay Area Sampling Position Cannot run the Eye Finder at this time How the Selected Position BehavesHow the Suggested Position Behaves XX% complete 163 Cannot run the Logic Analyzer at this timeCharacterizer cannot be loaded Complete Date Select one or more labels in the Eye Finder Setup tab 165 Timeout N K clocks in 5 secThis channel appears to be completely quiet Two common possibilities exist 166 Run Eye Finder to characterize this channelSee individual channels for messages Stable region extends beyond the limits of the display Disk is probably full Numerical value for the item XXX could not be read Unsupported revision level AA.BB Failed to open file for reading/writing NameFile Name already exists. Overwrite? Invalid true/false flag 169 Eye Finder Setup Tab 170 Eye Finder Advanced Settings Dialog 171 File Info Tab Save As Eye Scan ModeReload Save 173 Selecting the Eye Scan Mode on Specify the logic analyzer pod and clock threshold voltages Expander cards which cannot be used in the clock setupFormat Tab Data Pods Pod Assignment DialogName Type 176 Trigger Tab 177 Trigger Functions Subtab 178 General Timing Trigger Functions 179 180 General State Trigger Functions 181 Find pattern1 eventually followed by pattern2 182 183 Advanced Trigger Functions 184 Searched for Turbo State Trigger FunctionsState Trigger Functions Advanced pattern1 or pattern2 186 187 Half Channel State Trigger Functions 188 Settings SubtabCount Intermodule Control 189 Overview SubtabThis tab gives a picture of the trigger sequence Group events Default Storing SubtabEvent Specification List At start Acquisition 191 Status SubtabSave/Recall Subtab 192 Creating trigger function libraries Multiple files Symbols TabTwo kinds of symbols are available That you use to set up resource terms 194 Object file versions See Also 195 Symbols Selector DialogMatching Symbols Address masking is done by the Align to x Byte option Search PatternOffset By Option Qualifies any address from 100C through 100F Symbol File FormatsAlign to x Byte Option Byte option allows you to mask off an address 198 General-Purpose Ascii GPA Symbol File Format107 file 199 GPA Record Format SummaryFormat 200 RecordsDefinitions in the file Last address of the section, in hexadecimal Symbol representing the name of the sectionSymbol representing the function name First address of the section, in hexadecimal 202 You can specify symbols for variables usingName of a file Number of a line in the file, in decimal 203 Comments Collapse Shows labels only Select All Selects all channels Eye Scan TabLabels Subtab Expand Time Scan Settings SubtabRun Mode Scan Range 206 Advanced Subtab Custom ShortMedium Long Names for Qualifier SubtabQualification Clock Edge to Sample 209 Comments Subtab Calibration Messages Calibration TabCalibration Instructions Calibration Status 211 Error Messages 212 Branch expression is too complexGeneral Guidelines 213 Specific Guidelines 200 Mb/s State and all Timing Modes 214 If the following sequence does not compileThis one may Specific Guidelines 400 Mb/s State Modes 215 216 Specific Guidelines 800 Mb/s State ModeSpecific Guidelines 1250/1500 Mb/s State Mode 217 Last sequence level calls goto next Goto action specifies an undefined levelHardware Initialization Failed Possible Causes Timing sampling mode, flags are are always available Maximum of 32 Channels Per LabelMust assign another pod pair to specify actions for flags No more Edge/Glitch resources available for this pod pair 220 Possible SolutionsNo more Pattern resources available for this pod pair Phrase some of the edges as patterns 221 No Trigger action found in the trace specificationSlow or Missing Clock 222 Trigger function initialization failure 223 Trigger inhibited during timing prestoreTrigger Specification is too complex Then the approximate time is 32 seconds 224 Combiner resource allocation guidelinesEvent 225 Waiting for TriggerMisaligned boundaries for addresses 226 To save a trigger setup on 227 Specifications and CharacteristicsOperating temperature 0 to 45 degrees C Probes E5378A Input Equivalent Circuit E5378A Single-Ended Probe Specifications CharacteristicsE5379A Differential Probe Specifications Characteristics All specifications are marked by * asterisk 229 E5379A Input Equivalent Circuit 230 1500 Mb/s Sampling Mode Specifications and CharacteristicsE5380A Input Equivalent Circuit 231 Characteristics 232 233 400 Mb/s Sampling Mode Specifications Characteristics 234 200 Mb/s Sampling Mode Specifications Characteristics 235 Conventional Timing Mode Specifications and CharacteristicsTransitional Timing Mode Specifications and Characteristics All specifications are marked by * asterisk 236 What is a Specification? 237 What is a Characteristic?What is a Function Test? Referred to as an operational accuracy calibration 238 239 Concepts 240 Understanding Logic Analyzer TriggeringConveyor Belt Analogy 241 Conveyor belt analogy Next Sequence Levels on Summary of Triggering CapabilitiesSequence Levels Next Summary of Triggering Capabilities on 243 Addr Data 244 Boolean Expressions Next Ranges on BranchesEdges Ranges Trigger Sequence for Module FlagsOccurrence Counters and Global Counters Next Flags on An edge followed by an edge with a time limit TimersNext Timers on An example trigger sequence to set up this measurement is Needed Default StorageStorage Qualification Next Storage Qualification on 250 Sequence Level Storage 251 Strategies for Setting Up TriggersNext Strategies for Setting Up Triggers on Trigger Functions 252 Agilent 16715A trigger user interfacePattern2 occurring immediately after Pattern1 253 Same trigger as If/Then statementsStore range until pattern occurs Next Document Your Trigger Sequences on Setting Up Complex TriggersNext Setting Up Complex Triggers on Document Your Trigger Sequences Inline documentation on an Agilent logic analyzer ConclusionsDifferent parts of the trigger to describe how they work Next Conclusions on 256 Understanding State Mode Sampling PositionsTo accurately capture data on a bus 257 258 Window 259 Understanding Eye Scan Measurements 260 261 Measurements run simultaneously in parallel Voltage resolution that can be set is 1 mVUsing the Logic Analyzer in Eye Scan Mode on Are multiple logic analyzer cards in a module in this case 263 GlossaryAsterisk * See edge terms, glitch, and labels 264 Divided into 1K 64-state records 265 Debug mode See monitor 266 Ethernet address See link-level 267 268 269 Module/probe interconnect cable 270 By the channel width of the instrumentProcessor probe See emulation 271 Measurements 272 273 274 275 Index 251 276 247 277 122 278 180 279 280 Label values, symbolic, 105 labels, 22 Positive logic 281 242 282 107 283 Wait for other machine to trigger 284 Publication Number 5988-9044EN January 1