PRELIMINARY

CALIBRATION

CALIBRATION

NOTE

Because the 100 MHz Calibration DAC is an 8-bit DAC, adjustment resolution is typically 400 Hz/step.

6.Calibrate the YIG Frequency Linearizer DACs as follows:

a.At the $ prompt, type: calterm 127 and press <ENTER>.

b.Follow the instructions on the screen. Enter the value of the frequency counter reading as XXXX MHz.

cRecord step completion on the Test Record.

7.Calibrate the 100 MHz Reference Oscillator as follows:

a.If Option 16 (High Stability Time Base) is in- stalled, disconnect the cable at A3J6.

b.Connect the frequency counter to the 682XXB/ 683XXB RF output connector.

c.At the $ prompt, type: calterm 130 and press <ENTER>.

d.Follow the instructions on the screen.

e.Reconnect the cable to A3J6, if removed.

f.If Option 16 is installed, use a Phillips screw- driver and remove the screw on top of the

10 MHz High Stability Crystal Oscillator as- sembly to gain access to the timebase adjust- ment screw.

g.Using the Phillips screwdriver, adjust the ti- mebase to obtain a frequency counter reading of exactly 10 GHz.

h.Record step completion on the Test Record.

8.Calibrate the Ramp Center DAC as follows:

a.At the $ prompt, type: calterm 129 and press <ENTER>. (The $ prompt will appear on the screen when the calibration is complete.)

b.Record step completion on the Test Record.

9.Calibrate the Sweep Width DAC as follows:

a.At the $ prompt, type: calterm 133 and press <ENTER>. (This calibration can take ap- proximately 2 minutes to complete.)

The $ prompt will appear on the screen when the calibration is complete.

b.Record step completion on the Test Record.

682XXB/683XXB MM

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Anritsu 683XXB, 682XXB manual Preliminary

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.