PERFORMANCE

INTERNAL TIME BASE

VERIFICATION

AGING RATE TEST

3-6INTERNAL TIME BASE

The following test can be used to verify that the 682XXB/683XXB

 

AGING RATE TEST

10 MHz time base is within its aging specification. The instrument de-

 

(Optional)

rives its frequency accuracy from an internal 100 MHz crystal oscilla-

 

 

 

 

 

 

tor standard. (With Option 16 installed, frequency accuracy is derived

 

 

 

 

 

 

from an internal high-stability 10 MHz crystal oscillator.) An inherent

 

 

 

 

 

 

characteristic of crystal oscillators is the effect of crystal aging within

 

 

 

 

 

 

the first few days to weeks of operation. Typically, the crystal oscilla-

 

 

 

 

 

 

tor’s frequency increases slightly at first, then settles to a relatively

 

 

 

 

 

 

constant value for the rest of its life. The 682XXB/683XXB reference

 

 

 

 

 

 

oscillator aging is specified as <2x10–8parts per day (<5x10–10with

 

 

 

 

 

 

Option 16).

 

 

 

 

 

 

 

 

 

NOTES

 

 

 

 

 

 

 

 

 

Do not confuse crystal aging with other short term

 

 

 

 

 

 

 

 

 

frequency instabilties; i.e., noise and temperature. The

 

 

 

 

 

 

 

 

 

internal time base of the instrument may not achieve its

 

 

 

 

 

 

 

 

 

specified aging rate before the specified warm-up time of

 

 

 

 

 

 

 

 

 

7 to 30 days has elasped; therefore, this performance test is

 

 

 

 

 

 

 

 

 

optional.

 

 

 

 

 

 

For greatest absolute frequency accuracy, allow the 682XXB/683XXB

 

 

 

 

 

 

to warm up until its RF output frequency has stabilized (usually 7 to

 

 

 

 

 

 

30 days). Once stabilized, the change in reference oscillator frequency

 

 

 

 

 

 

should remain within the aging rate if; (1) the time base oven is not al-

 

 

 

 

 

 

lowed to cool, (2) the instrument orientation with respect to the earth’s

 

 

 

 

 

 

magnetic field is maintained, (3) the instrument does not sustain any

 

 

 

 

 

 

mechanical shock, and (4) ambient temperature is held constant. This

 

 

 

 

 

 

test should be performed upon receipt of the instrument and again af-

 

 

 

 

 

 

ter a period of several days to weeks to fully qualify the aging rate.

 

 

 

 

 

 

 

 

 

682XXB/683XXB

 

 

 

 

 

 

10MHz

 

 

 

FrequencyReference

 

 

REFOUT

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

1PPS

1.5MHz

10MHz

ABSOLUTETIME

Model300FrequencyReference

ESC 1 2 3

- 4 5 6

DEL 7 8 9

MOD . 0 ENTER

10MHzInput

Figure 3-1.Equipment Setup for Internal Time Base Aging Rate Test

Test Setup Connect the 682XXB/683XXB rear panel 10 MHz REF OUT to the Frequency Reference front panel input connector labeled 10 MHz when directed to do so during the test procedure.

3-8

682XXB/683XXB MM

Page 67 Page 69
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Image 68
Anritsu 682XXB, 683XXB manual Performance
Page 67 Page 69

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
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