PERFORMANCE

 

 

 

SINGLE SIDEBAND

VERIFICATION

 

 

 

PHASE NOISE TEST

3-10SINGLE SIDEBAND

The following test can be used to verify that the signal generator

PHASE NOISE TEST

meets its single sideband phase noise specifications. For this test, a

 

second 682XXB/683XXB is required. This additional instrument acts

 

as a local oscillator (LO). The CW RF output of the 682XXB/683XXB

 

under test (DUT) is mixed with the CW RF output from the 682XXB/

 

683XXB LO which is offset by 1 MHz. Single sideband phase noise is

 

measured at offsets of 100 Hz, 1 kHz, 10 kHz, and 100 kHz away from

 

the resultant 1 MHz IF.

 

 

 

 

 

 

682XXB / 683XXB (LO)

 

 

HP 3585B

 

 

Spectrum Analyzer

682XXB / 683XXB (DUT)

 

 

 

 

 

 

 

 

 

 

EXTERNAL

10 MHzREF INPUT BNC TEE REF IN

10MHz

REF OUT

RF OUT

RF OUT

X

L R

10 dB

MixerAttenuator

Figure 3-5.Equipment Setup for Single Sideband Phase Noise Test

Test Setup Connect the equipment, shown in Figure 3-5, as fol- lows:

1. Connect the 682XXB/683XXB DUT rear panel 10 MHz REF OUT to the BNC tee. Connect one leg of the tee to the 682XXB/683XXB LO rear panel 10 MHz REF IN. Connect the other leg of the tee to the Spectrum Analyzer External Reference In- put.

2. Connect the 682XXB/683XXB DUT RF OUTPUT to the Mixer’s R input via a 10 dB attenuator.

3. Connect the 682XXB/683XXB LO RF OUTPUT to the Mixer’s L input.

4. Connect the Mixer’s X output to the Spectrum Analyzer 50￿ input.

3-22

682XXB/683XXB MM

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Anritsu 682XXB, 683XXB manual Performance Single Sideband Verification Phase Noise Test, 10SINGLE Sideband
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682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
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