PERFORMANCE

AMPLITUDE

VERIFICATION

MODULATION TEST

3-12AMPLITUDE

This procedure verifies the operation of the 682XXB/683XXB ampli-

MODULATION TEST

tude modulation input sensitivity circuit.

 

The RF OUTPUT of the 682XXB/683XXB is monitored on a Spectrum

 

Analyzer display. The (modulated) IF Output of the Spectrum Ana-

 

lyzer is monitored with a Modulation Analyzer. A 50% AM (default

 

value) signal is set to a reference point on the Spectrum Analyzer. The

 

actual modulation value is then computed from the indicated Modula-

 

tion Meter values. (The absolute values of the AM PK+ and AM PK–

 

readings are used in the given formula to compensate for non-linearity

 

errors in the test equipment.)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Modulation

 

 

 

 

 

 

 

 

 

 

 

Analyzer

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

682XXB / 683XXB

10 MHz

REF OUT

RF Input

EXT

REF Input

IF Output

RF

OUTPUT

RF Input

Spectrum

Analyzer

Figure 3-7.Equipment Setup for Amplitude Modulation Tests

Test Setup Connect the equipment, shown in Figure 3-7, as fol- lows:

1. Connect the 682XXB/683XXB rear panel 10 MHz REF OUT to the Spectrum Analyzer External Reference Input.

2. Connect the IF Output of the Spectrum Analyzer to the RF Input of the Modulation Analyzer.

3. Connect the RF OUTPUT of the 682XXB/683XXB to the Spectrum Analyzer RF Input.

3-30

682XXB/683XXB MM

Page 89 Page 91
Page 90
Image 90
Anritsu 682XXB, 683XXB manual Performance Amplitude Verification Modulation Test
Page 89 Page 91

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
Top Page Image Contents