ALC SLOPE

CALIBRATION

CALIBRATION

CAUTION

When saving calibration data, turn- ing off the instrument before the $ prompt returns to the screen can cause all stored data to be lost.

f.Press Sweep Ramp . At the resulting Step Sweep Ramp Menu, press Num of Steps and set the number of steps to 200.

g.Press Step to return to the Step Sweep Menu display.

7.Make the following selections on the 562 Network Analyzer to normalize the step sweep.

a.Press CALIBRATION and follow the menu on the display.

b.Press AUTOSCALE.

c.Press OFFSET/RESOLUTION and set the Resolution to 0.2 dB.

8.On the 683XXB, press Analog to select the ana- log sweep mode.

9.Adjust the ALC Slope DAC for frequencies >2 GHz as follows:

a.At the $ prompt on the PC display, type: calset and press <ENTER>.

b.Type 1 and press <ENTER>.

c.Select item 11 (ALC Slope Main) from the menu. Follow the instructions presented at the bottom of the screen to enter a new DAC set- ting value.

d.Enter different DAC setting values to find the setting that adjusts the slope so that the power at the start and stop frequencies match the normalized straight line in step sweep mode.

e.When finished, exit the program.

f.Type X and press <ENTER> to exit the calset menu. (The $ prompt will appear on the screen.)

g.Record step completion on the Test Record.

10.Store the new DAC setting values in non-volatile memory (EEPROMs) on the A17 CPU PCB as fol- lows:

a.Type: calterm 787 and press <ENTER>. (The $ prompt will appear on the screen when the data has been stored.)

b.Record step completion on the Test Record.

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682XXB/683XXB MM

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Anritsu 682XXB, 683XXB manual ALC Slope

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.