TROUBLESHOOTING

TROUBLESHOOTING

TABLES

Table 5-13.Error Messages 113 and 115 (1 of 2)

A7 YIG Loop

Error 113 YIG Loop Osc Failed

Error 115 Not Locked Indicator Failed

Description: Error 113 indicates that the YIG loop is not phase- locked. Error 115 indicates a failure of the not phased-lock indicator circuit.

Step 1. Verify the signal output from the A4 Coarse Loop PCB by performing steps 5 thru 7 in Table 5-11.

If the coarse loop signals are correct in both frequency

qand amplitude, go to step 2.

If the coarse loop signals are incorrect, replace the A4 PCB.

Step 2. Verify the signal output from the A5 Fine Loop PCB by per- forming steps 9 thru 11 in Table 5-9.

If the fine loop signals are correct in both frequency and

qamplitude, go to step 3.

If the fine loop signals are incorrect, replace the A5 PCB.

Step 3. Disconnect the semi-rigid cable at output port J5 of the switched filter assembly.

Step 4. Set up the 682XXB/683XXB to generate a CW frequency of 2.000 GHz.

Step 5. Using a spectrum analyzer, measure the frequency and am- plitude of the signal at J5 of the switched filter assembly. The frequency should be 2.000 GHz ￿25 MHz and the ampli- tude should be from –20 to –27 dBm.

If the signal is correct in both frequency and amplitude,

qgo to step 6.

If the signals are incorrect, replace the switched filter as- sembly.

Step 6. Repeat steps 4 and 5, incrementing the CW frequency in 1 GHz steps up to 20.000 GHz.

Step 7. If the signals from the coarse loop, fine loop, and switched filter assembly are all correct, replace the A7 YIG Loop PCB.

682XXB/683XXB MM

5-33

Page 198 Page 200
Page 199
Image 199
Anritsu 683XXB, 682XXB manual A7 YIG Loop
Page 198 Page 200

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
Top Page Image Contents