PERFORMANCE

INTERNAL TIME BASE

VERIFICATION

AGING RATE TEST

Test

The frequency error is measured at the start and

Procedure

finish of the test time period of 24 hours. The aging

 

rate is the difference between the two error read-

 

ings.

 

1. Set up the Frequency Reference as follows:

 

a. Press the ESC key until the MAIN MENU is

 

displayed.

 

b. At the MAIN MENU display, press 1 to select

 

CONFIGURATION.

 

c. At the CONFIGURATION MENU display,

 

press 8 to select MEAS.

 

d. Press the MOD key and use the Up/Down Ar-

 

row keys to get to the menu display:

 

MEASUREMENT = FREQ.

 

e. Press the ENTER key.

 

f. Press the ESC key until the MAIN MENU is

 

displayed.

 

g. At the MAIN MENU display, press 3 to select

 

the REVIEW MENU.

 

h. At the REVIEW MENU display, press 8 to se-

 

lect TFM.

 

2. Connect the 682XXB/683XXB rear panel 10 MHz

 

REF OUT signal to the Frequency Reference front

 

panel 10 MHz input.

 

3. Wait approximately 90 minutes (default setting)

 

until the FMFOM on the Frequency Reference

 

display decreases from 9 to 1. (The default setting

 

is recommended to achieve optimum mease-

 

ments.)

 

The frequency error in the signal under test is

 

displayed in ps/s (Picoseconds/Second). For exam-

 

ple, an error of –644681 ps/s is –644681 ￿ 10–12or

 

–6.44681 ￿ 10–7away from the 10 MHz internal

 

reference of the Frequency Reference.

 

The frequency error display is continuously up-

 

dated as a running 5000-second average. The av-

 

eraging smooths out the short-term instability of

 

the oscillator.

682XXB/683XXB MM

3-9

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Anritsu 683XXB, 682XXB manual Test
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682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
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