PERFORMANCE

 

FREQUENCY

VERIFICATION

 

MODULATION TESTS

3-13FREQUENCY

This procedure verifies the operation of the 682XXB/683XXB fre-

MODULATION TESTS

quency modulation input sensitivity circuitry.

 

The RF OUTPUT of the 682XXB/683XXB is monitored on a Spectrum

 

Analyzer display. In Unlocked Wide FM mode, the Spectrum Analyzer

 

is used as a frequency counter to measure the actual FM deviation and

 

determine FM accuracy. In Unlocked Narrow, Locked, and Locked

 

Low-Noise FM modes, the Spectrum Analyzer is used to monitor the

 

carrier level. FM accuracy is determined by measuring the actual FM

 

deviation necessary to reduce the carrier level to its lowest level.

 

These tests qualify how the FM input signal affects the signal genera-

 

tor’s RF output.

 

 

 

682XXB / 683XXB

Spectrum Analyzer

EXT REF

INPUT

10 MHz

REF OUT

RF IN

RF OUT

Figure 3-8.Equipment Setup for Frequency Modulation Tests

Test Setup Connect the equipment, shown in Figure 3-8, as fol- lows:

1. Connect the 682XXB/683XXB rear panel 10 MHz REF OUT to the Spectrum Analyzer External Ref- erence Input.

2. Connect the RF OUTPUT of the 682XXB/683XXB to the Spectrum Analyzer RF Input.

FM Input The following procedure lets you measure the FM

Sensitivity deviation for a specific input sensitivity in Unlocked

Procedure Wide, Unlocked Narrow, Locked, and Locked Low-

Noise FM modes and determine FM accuracy.

682XXB/683XXB MM

3-33

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Anritsu 683XXB, 682XXB manual Performance Frequency Verification Modulation Tests, 13FREQUENCY
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682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
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