PRELIMINARY

CALIBRATION

CALIBRATION

NOTE

To save the calibration data after completing any calibration step, type: calterm 787 and press <ENTER>.

Calibration Each of the steps in this procedure provides initial

Steps calibration of a specific 682XXB/683XXB circuit or component. To ensure accurate instrument calibra- tion, each step of this procedure must be performed in sequence.

1.Calibrate the internal DVM circuitry as follows:

a.At the $ prompt, type: calterm 119 and press <ENTER>. (The $ prompt will appear on the screen when the calibration is complete.)

b.Record step completion on the Test Record.

2.Calibrate the Coarse Loop Pretune DAC as fol- lows:

a.At the $ prompt, type: calterm 137 and press <ENTER>. (The $ prompt will appear on the screen when the calibration is complete.)

b.Record step completion on the Test Record.

3.Calibrate the Fine Loop Pretune DAC as follows:

a.At the $ prompt, type: calterm 136 and press <ENTER>. (The $ prompt will appear on the screen when the calibration is complete.)

b.Record step completion on the Test Record.

4.Calibrate the Sweep Time DAC as follows:

a.At the $ prompt, type: calterm 132 and press <ENTER>. (The $ prompt will appear on the screen when the calibration is complete.)

b.Record step completion on the Test Record.

5.Calibrate the YIG Frequency Offset DAC as fol- lows:

a.At the $ prompt, type: calterm 134 and press <ENTER>.

b.Follow the instructions on the screen.

NOTE

Adjust the DAC to the number that will get the closest to the 1.9 GHz and 8.3 GHz called for by the procedure.

c. Record step completion on the Test Record.

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682XXB/683XXB MM

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Anritsu 682XXB, 683XXB manual Preliminary

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.