SUBJECT

 

INDEX

N - T

N

Normal Operation Error/Warning Messages, 5-7

O

Options, List of, 1-7

P

Parts and Subassemblies, Replaceable, 1-14 Parts Ordering Information, 1-14

ANRITSU Service Centers, 1-14

Performance Verification Tests, 3-3

Preventive Maintenance

Fan Filter Cleaning, 1-9

R

Rear Panel Assembly

Remove/Replace Procedures, 6-13

Recommended Test Equipment, 1-12

Removal and Replacement Procedures A13, A14, or A15 PCB, 6-11

A16 or A17 PCB, 6-11

A18 or A19 PCB, 6-12

A21 Line Filter/Rectifier PCB, 6-16

A21-1 BNC/AUX I/O Connector PCB, 6-17 A3, A4, A5, or A6 PCBs, 6-8

A7 YIG Loop PCB, 6-10

A8, A9, A10, A11, or A12 PCB, 6-10

Assembly and Component Locator Diagram, 6-9 Chassis Covers, 6-4

Fan Assembly, 6-18

Front Panel Assembly, 6-6

Rear Panel Assembly, 6-13

Replaceable Subassemblies and Parts, 1-14

RF Deck Assemblies

Block Diagram, 2-21 - 2-22, 2-27 - 2-28

Functional Description, 2-19

S

Scope of Manual, 1-3

Self-Test Error Messages, 5-3

Startup Configurations, 1-11

Static-Sensitive Component Precautions, 1-9

T

Test Equipment, Recommended, 1-12Testing, Performance Verification

Amplitude Modulation Test, 3-30

Frequency Modulation Tests, 3-33

Frequency Synthesis Tests, 3-11

Harmonic Test: RF Output 2 to 20 GHz, 3-18 Internal Time Base Aging Rate Test, 3-8 Maximum Leveled Power Listing, 3-6 - 3-7 Phase Modulation Tests, 3-48

Power Level Accuracy and Flatness Tests, 3-26

Pulse Modulation Test: Overshoot, 3-39

Pulse Modulation Test: Pulse Level

Accuracy, 3-39

Pulse Modulation Test: RF On/RF Off

Ratio, 3-45

Pulse Modulation Test: Rise/Fall Time, 3-39

Pulse Modulation Test: Video

Feedthrough, 3-43

Single Sideband Phase Noise Test, 3-22

Spurious Signals Test: RF Output <2 GHz, 3-14

Test Equipment, 3-3

Test Record, 68237B/68337B, A-3 - A-14

Test Record, 68245B/68345B, A-19 - A-32

Test Record, 68247B/68347B, A-37 - A-50

Test Record, 68253B/68353B, A-55 - A-67

Test Record, 68255B/68355B, A-73 - A-87

Test Record, 68259B/68359B, A-93 - A-107

Test Record, 68263B/68363B, A-113 - A-125

Test Record, 68265B/68365B, A-131 - A-145

Test Record, 68269B/68369B, A-151 - A-165

Test Record, 68275B/68375B, A-171 - A-183

Test Record, 68277B/68377B, A-189 - A-201

Test Record, 68285B/68385B, A-207 - A-219

Test Record, 68287B/68387B, A-225 - A-237

Test Record, 68295B/68395B, A-243 - A-254

Test Record, 68297B/68397B, A-259 - A-270

Troubleshooting

Connector/Test Points Locator Diagram, 5-11

Malfunctions Not Displaying an Error

Message, 5-10

Normal Operation Error/Warning

Messages, 5-7

Self-Test Error Messages, 5-3

Troubleshooting Tables, 5-10,5-12 - 5-53

Index 2

682XXB/683XXB MM

Page 514
Image 514
Anritsu manual Subject Index, Index 682XXB/683XXB MM

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.