TROUBLESHOOTING

TROUBLESHOOTING

TABLES

Table 5-9.Error Message 111 (2 of 2)

Step 6. Using the spectrum analyzer, verify the presence of the +3 dBm ￿5 dB, 10 MHz signal at the end of the cable.

qIf present, replace the A4 PCB. If not present, go to step 7.

Step 7. Disconnect cable W105 at A3J4.

Step 8. Using the spectrum analyzer, verify the presence of the +3 dBm ￿5 dB, 10 MHz signal at A3J4.

qIf present, replace the cable W105. If not present, replace the A3 PCB.

Step 9. Reconnect cable W121 to A5J5 and disconnect cable W107 at

A5J1.

Step 10. Set up the 682XXB/683XXB to generate the CW frequencies listed in Table 5-10.

Step 11. Using a spectrum analyzer, measure the frequency and am- plitude of the signal at A5J1 for each of the CW frequencies generated. In each case, the signal amplitude should be +3 dBm ￿3 dB with sidebands at <–65 dBc.

If the signals are correct in both frequency and amplitude, go to step 12.

If the signals are incorrect, replace the A5 PCB.

Step 12. Reconnect cable W107 to A5J1 and run self-test again.

qIf error 111 is not displayed, the problem is cleared.

If error 111 is still displayed, contact your local ANRITSU service center for assistance.

Table 5-10.Fine Loop Frequencies

 

682XXB/683XXB

Measured Frequency

 

CW Frequency

at A5J1

 

 

 

 

 

10.102 GHz

22 MHz

 

 

 

 

 

10.110 GHz

30 MHz

 

 

 

 

 

10.120 GHz

40 MHz

 

 

 

 

 

 

 

 

682XXB/683XXB MM

5-31

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Anritsu manual 682XXB/683XXB Measured Frequency CW Frequency At A5J1
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682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
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