ALC SLOPE

CALIBRATION

CALIBRATION

3. Make the following selections on the 562 Network Analyzer to normalize the step sweep.

a. Press CALIBRATION and follow the menu on the display.

b. Press AUTOSCALE.

c. Press OFFSET/RESOLUTION and set the Resolution to 0.2 dB.

4. On the 683XXB, press Analog to select the ana- log sweep mode.

5. Adjust the ALC Slope DAC for frequencies ￿2 GHz as follows:

a. At the $ prompt on the PC display, type: calset and press <ENTER>.

b. Type: 1 and press <ENTER>.

c. Select item 10 (ALC Slope Het) from the menu.

Follow the instructions presented at the bot- tom of the screen to enter a new DAC setting value.

d. Enter different DAC setting values to find the setting that adjusts the slope so that the power at the start and stop frequencies match the normalized straight line in step sweep mode.

e. When finished, exit the program.

f. Type: X and press <ENTER> to exit the calset menu. (The $ prompt will appear on the screen.)

g. Record step completion on the Test Record.

6. Set up the 683XXB as follows:

a. Reset the instrument by pressing SYSTEM then Reset . Upon reset the CW Menu is dis- played.

b. Press Edit L1 and set L1 to 5 dB less than maximum leveled power for the instrument be- ing calibrated (refer to Table 3-2, page 3-6).

c. Press Step . The Step Sweep Menu is dis- played.

d. Press Edit F1 and set the F1 start frequency to 2.0 GHz.

e. Press Edit F2 and set the F2 stop frequency to upper limit of the 683XXB.

682XXB/683XXB MM

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Anritsu 683XXB, 682XXB manual ALC Slope

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.