PERFORMANCE

HARMONIC TEST: RF OUTPUT

VERIFICATION

SIGNALS FROM 2 TO 20 GHz

Test Procedure (2 to 10 GHz)

Table 3-4.Spurious Signals Specifications

Harmonic and Harmonic Related:

 

500 MHz to 2.2 GHz (68XX5B):

<–50 dBc

10 MHz to £50 MHz:

<–30 dBc

>50 MHz to £2 GHz:

<–40 dBc

>2 GHz (2.2 GHz for 68XX5B)

 

to £20 GHz:

<–60 dBc

>20 GHz to 40 GHz:

<–40 dBc

Harmonic and Harmonic Related (Models having a high-end frequency of >40 GHz and units with Op- tion 15B at maximum specified leveled output power):

500 Mhz to £2.2 GHz (68XX5B):

<–50 dBc

10

MHz to £50 MHz:

 

<–30 dBc

>50 MHz to £2 GHz:

 

<–40 dBc

>2 GHz (2.2 GHz for 68XX5B)

 

to £20 GHz:

 

<–50 dBc

>20 GHz to £40 GHz:

 

<–40 dBc

50

GHz units: >40 GHz to

50 GHz:

<–40 dBc

60

GHz units: >40 GHz to

60 GHz:

<–30 dBc

65

GHz units: >40 GHz to £45 GHz:

<–25 dBc

 

>45 GHz to £65 GHz: <–30 dBc

Non-Harmonics:

 

 

500 MHz to £2.2 GHz (68XX5B):

<–50 dBc

10

MHz to £2 GHz:

 

<–40 dBc

>2 GHz (2.2 GHz for 68XX5B)

 

to £65 GHz:

 

<–60 dBc

 

 

 

 

The following procedure lets you measure the 2 to 10 GHz (2.2 to 10 GHz for 68XX5Bs) RF output har- monic levels to verify that they meet specifications.

1.Set up the 682XXB/683XXB as follows:

a.Reset the instrument by pressing SYSTEM , then Reset . Upon reset the CW Menu is dis- played.

b.Press Edit L1 to open the current power level parameter for editing.

c.Set L1 to the lesser of +10 dBm or the maxi- mum leveled power level for the instrument being tested (refer to Table 3-2, page 3-6).

d.Press Edit F1 to open the current frequency parameter for editing.

e.Set F1 to the frequency indicated on the Test Record.

2.Set up the Spectrum Analyzer as follows:

a.Span: 5 kHz/div

b.CF: Set to the 682XXB/683XXB frequency value.

c.RBW: 1 kHz

d.Video Filter Wide: On

3.Adjust the Spectrum Analyzer Peaking control for maximum signal level, then adjust the Refer- ence Level Control to place the signal at the top of the screen graticule.

4.Change the Spectrum Analyzer CF to each of the harmonic frequencies listed on the Test Record and record the signal levels. Refer to Table 3-4 for the specified harmonic signal level limits.

5.Repeat steps 1 through 4 for each of the 682XXB/ 683XXB CW carrier and harmonic frequencies listed on the Test Record. Record the harmonic signal levels on the Test Record.

682XXB/683XXB MM

3-19

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Anritsu 683XXB, 682XXB manual Test Procedure 2 to 10 GHz
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682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
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