PERFORMANCE

PULSE MODULATION TESTS:

VERIFICATION

RISE TIME, FALL TIME, OVERSHOOT, AND LEVEL

Rise/Fall

The following procedure lets you measure the rise

Time and

time, fall time, and overshoot parameters of the

Overshoot

pulse modulation waveform.

 

1. Set up the 682XXB/683XXB as follows:

 

a. Reset the instrument by pressing

 

 

 

 

,

 

 

 

SYSTEM

 

 

then

Reset

. Upon reset, the CW Menu is dis-

 

 

played.

 

b. Press

 

 

 

 

to open the current frequency

 

Edit F1

 

 

parameter for editing.

 

c. Set F1 to 5.0 GHz.

 

d. Press

 

 

 

to open the current power level

 

Edit L1

 

 

parameter for editing.

 

e. Set L1 to the maximum leveled output power

 

 

level for the instrument being tested (refer to

 

 

Table 3-2, page 3-6).

 

f. Press

 

 

 

 

, then

 

 

 

. The Inter-

 

MODULATION

Pulse

 

 

 

nal Pulse Status menu is displayed.

 

g. At the Internal Pulse Status menu, press

 

 

Edit Width

and set pulse width W1 to 5.0 ￿s.

 

h. Press

 

 

and set the PRI to 0.01 ms.

 

Edit Period

 

i. Press

 

to turn pulse modulation on.

 

On/Off

 

2. On the Oscilloscope, turn off CH.4. Observe the

 

output of the Pulse Detector on the Oscilloscope.

 

Refer to Figure 3-11 to interpret the detector

 

waveform. Adjust the Oscilloscope controls to

 

measure the following waveform parameters.

 

a. Rise/Fall Time (10 to 90%): <10 ns

 

b. Pulse Width: 5 ￿s ￿10 ns (5 ns, typical)

 

c. PRI: 0.010 ms ￿10 ns (5 ns, typical)

 

d. Overshoot: <10%

 

3. Record the results on the Test Record.

3-40

682XXB/683XXB MM

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Anritsu 682XXB, 683XXB manual Modulation
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682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
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