FUNCTIONAL

FREQUENCY

DESCRIPTION

SYNTHESIS

A3 Reference Loop

A4 Coarse Loop

10 MHz

 

 

10 MHz

 

A5 Fine Loop

 

 

 

 

 

 

Phase

 

 

 

 

 

 

 

 

 

 

 

 

Frequency

Error

206 - 391 MHz

10 MHz REF In

 

 

 

Phase/

10 MHz

÷10

10 MHz

Frequency

 

 

÷10

1 MHz

÷100

Synthesizer

VCO

 

100 kHz

 

 

 

Detector

 

 

 

Phase

 

 

 

Error

 

 

10 MHz

100 MHz

100 MHz

500 MHz

Reference

 

x5

Hi-Stability

 

Oscillator

 

 

XTAL Oscillator

 

 

 

 

 

(Optional)

 

 

 

Divider

Control

Phase/

Frequency

Detector

1 MHz

Frequency

Divider

Phase

Error

10 - 61 MHz

500 MHz

Coarse

Loop

Oscillator

439 - 490 MHz

÷2

219.5 -

 

Phase/

245 MHz

 

 

Frequency

 

 

 

 

Detector

 

 

 

 

 

Phase Error

 

 

 

 

 

 

 

26.84 MHz

 

 

VCXO

 

 

 

 

100 kHz

Digital

Synthesizer

9 - 10 MHz

9 - 10 MHz

 

 

Phase

 

Phase/

 

Error

 

Frequency

 

 

 

 

 

Detector

 

 

 

 

 

 

Fine

Loop

Oscilator

215-

400 MHz

÷10

21.5 - 40 MHz

FM Sweep (From A12 PCB)

A11 FM

A7 YIG Loop

SRD

1.9755 to 20 GHz

Sampler

219.5 - 245 MHz

Harmonics

 

FM In (Front Panel or Rear Panel)

Internal FM (From A8 PCB)

FM

FM Sweep

÷128

21.5 -

40 MHz IF

FM

FM

COIL

DRIVER

LPF

YIG Loop Error

Phase/

 

Frequency

÷128

Detector

21.5 - 40 MHz

 

Sampled 2 - 20 GHz RF

Tune

(From A12 PCB)

+18VG

A13 YIG Driver

Main

Coil

Drivers

Bias

Regulators

 

P/O Switched Filter

 

YIG - Tuned

FM

Oscillator

 

Main

2 - 20 GHz

Bias

RF Out

 

Modulator Pulse

Contol

Figure 2-2.Block Diagram of the Frequency Synthesis Subsystem

682XXB/683XXB MM

2-11

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Image 39
Anritsu 683XXB, 682XXB manual A4 Coarse Loop, A5 Fine Loop, A11 FM A7 YIG Loop, A13 YIG Driver, Switched Filter

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.