PERFORMANCE

SPURIOUS SIGNALS TEST: RF OUTPUT SIGNALS

VERIFICATION

￿2 GHz (￿2.2 GHz for 68XX5B MODELS)

3-8SPURIOUS SIGNALS TEST: RF OUTPUT SIGNALS ￿2 GHz (￿2.2 GHz for 68XX5B

MODELS)

The following test can be used to verify that the signal generator meets its spurious signals specifications for RF output signals from

0.01to 2 GHz (0.5 to 2.2 GHz for 682X5B/683X5B Models). This test is applicable only to instruments which cover the frequency range 10 MHz to 2 GHz (500 MHz to 2.2 GHz for 682X5B/683X5B models). The

0.01to 2 GHz test procedure begins on this page; the 0.5 to 2.2 GHz test procedure begins on page 3-17.

682XXB / 683XXB

Spectrum Analyzer

EXT REF

INPUT

10 MHz

REF OUT

RF IN

RF OUT

Figure 3-3.Equipment Setup for Spurious Signals Test: RF Output Signals £2 GHz

Test Setup Connect the equipment, shown in Figure 3-3, as fol- lows:

1. Connect the 682XXB/683XXB rear panel 10 MHz REF OUT to the Spectrum Analyzer External Ref- erence Input.

2. Connect the 682XXB/683XXB RF OUTPUT to the Spectrum Analyzer RF Input.

0.01- 2 GHz The following procedure lets you measure the worst

Test

case spurious signals (harmonic and non-harmonic)

Procedure

of the 0.01 to 2 GHz RF output to verify that they

 

meet specifications.

 

1. Set up the Spectrum Analyzer as follows:

 

a. Span: 10 MHz/div

 

b. CF: 50 MHz

 

c. RBW: 1 MHz

 

d. Sweep Time/Div: Auto (to resolve signal peaks

 

clearly)

3-14

682XXB/683XXB MM

Page 74
Image 74
Anritsu 682XXB, 683XXB manual GHz 2.2 GHz for 68XX5B Models

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.