SELF-TEST

TROUBLESHOOTING

ERROR MESSAGES

Table 5-1.Self-Test Error Messages (2 of 3)

Error Message

Troubleshooting

Page

Table

Number

 

 

 

 

Error 120

5-16

5-36

Delta-F Circuits Failed

 

 

 

 

 

Error 121

5-17

5-37

Unleveled Indicator Failed

 

 

 

 

 

Error 122

5-17

5-37

Level Reference Failed

 

 

 

 

 

Error 123

5-17

5-37

Detector Log Amp Failed

 

 

 

 

 

Error 124

5-18

5-39

Full Band Unlocked and

 

 

Unleveled

 

 

 

 

 

Error 125

5-18

5-39

8.4 – 20 GHz Unlocked and

 

 

Unleveled

 

 

 

 

 

Error 126

5-18

5-39

2 – 8.4 GHz Unlocked and

 

 

Unleveled

 

 

 

 

 

Error 127

5-17

5-37

Detector Input Circuit

 

 

Failed

 

 

 

 

 

Error 128

5-20

5-41

.01 – 2 GHz Unleveled

 

 

 

 

 

Error 129

5-20

5-44

Switched Filter or Level

 

 

Detector Failed

 

 

 

 

 

Error 130

5-20

5-47

2 – 3.3 GH Switched Filter

 

 

 

 

 

Error 131

5-20

5-47

3.3 – 5.5 GH Switched Filter

 

 

 

 

 

Error 132

5-20

5-47

5.5 – 8.4 GH Switched Filter

 

 

 

 

 

Error 133

5-20

5-47

8.4 – 13.25 GH Switched Filter

 

 

 

 

 

Error 134

5-20

5-47

13.25 – 20 GH Switched Filter

 

 

 

 

 

Error 135

5-20

5-48

Modulator or Driver Failed

 

 

 

 

 

Error 142

5-17

5-37

Sample and Hold Circuit

 

 

Failed

 

 

 

 

 

Error 143

5-17

5-38

Slope DAC Failed

 

 

 

 

 

682XXB/683XXB MM

5-5

Page 171
Image 171
Anritsu 683XXB, 682XXB manual Self-Test Error Messages 2

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.