PERFORMANCE

HARMONIC TEST: RF OUTPUT

VERIFICATION

SIGNALS FROM 2 TO 20 GHz

Test

The following procedure lets you measure the 11 to

Procedure

20 GHz RF output harmonic levels to verify that

(11 to 20 GHz) they meet specifications.

NOTE

Because an external mixer is required for these measurements, the RF output flat- ness of the signal generator is used to cor- rect for; (1) variations caused by switching from the fundamental input to the external mixer input of the Spectrum Analyzer, and

(2) the flatness of the mixer.

1. Set up the 682XXB/683XXB as follows:

a. Reset the instrument by pressing SYSTEM , then Reset . Upon reset the CW Menu is dis- played.

b. Press Edit F1 to open the current frequency parameter for editing.

c. Set F1 to the frequency indicated on the Test Record.

d. Press Edit L1 to open the current power level parameter for editing.

e. Set L1 to –30 dBm output power.

NOTE

If the 682XXB/683XXB is not fitted with Option 2, install a 30 dB attenuator (AN- RITSU 41KC-20 and 41KC-10 for ￿40 GHz models; 41V-20 and 41V-10 for >40 GHz models) and set L1 to 0.0 dBm output power.

2. Set up the Spectrum Analyzer as follows: a. Span: 5 kHz/div

b. CF: Set to the 682XXB/683XXB frequency value.

c. RBW: 1 kHz

d. Video Filter Wide: On

3. Adjust the Spectrum Analyzer Peaking control for maximum signal, then adjust the Reference Level control to place the signal at the top of the screen graticule. It may be necessary to also ad- just the 682XXB/683XXB output power level

3-20

682XXB/683XXB MM

Page 79 Page 81
Page 80
Image 80
Anritsu 682XXB, 683XXB manual Following procedure lets you measure the 11 to
Page 79 Page 81

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
Top Page Image Contents