MALFUNCTIONS NOT DISPLAYING

TROUBLESHOOTING

AN ERROR MESSAGE

5-4

5-5

MALFUNCTIONS NOT The 682XXB/683XXB must be operating to run self-test. Therefore, DISPLAYING AN ERROR malfunctions that cause the instrument to be non-operational do not

MESSAGEproduce error messages. These problems generally are a failure of the 682XXB/683XXB to power up properly. Table 5-4, beginning on page 5-12, provides troubleshooting procedures for these malfunctions.

Malfunctions related to pulse modulating the RF output do not pro- duce error messages. In those 682XXB/683XXB models that produce RF outputs of >40 GHz, malfunctions related to quadrupling the source signal do not generate error messages. Troubleshooting proce- dures for these malfunctions are included in Table 5-4.

TROUBLESHOOTING Tables 5-4 through 5-27, beginning on page 5-12, provide procedures

TABLESfor isolating malfunctions to a replaceable subassembly or RF compo- nent. In those cases where any of several subassemblies or RF compo- nents could have caused the problem, subassembly/RF component re- placement is indicated. The recommended replacement order is to replace first the subassemblies/RF components that are most likely to have failed.

Figure 5-1, on the following page, shows the location of the 682XXB/ 683XXB connectors and test points that are called out in the trouble- shooting procedures of Tables 5-4 through 5-27.

CAUTION

Never remove or replace a subassembly or RF component with power applied. Serious damage to the instrument may occur.

5-10

682XXB/683XXB MM

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Anritsu 682XXB, 683XXB manual Malfunctions not Displaying, Troubleshooting AN Error Message
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682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
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