Anritsu 682XXB, 683XXB - page 61

Table of Contents
3-1 INTRODUCTION ...................3-3
3-2 RECOMMENDED TEST EQUIPMENT .......3-3
3-3 TEST RECORDS ...................3-3
3-4 CONNECTOR AND KEY LABEL NOTATION . . . 3-3
3-5 682XXB/683XXB POWER LEVELS .........3-6
3-6 INTERNAL TIME BASE AGING RATETEST . . . 3-8
Test Setup ....................3-9
Test Procedure..................3-9
EXAMPLE:...................3-10
3-7 FREQUENCY SYNTHESIS TESTS ........3-11
Test Setup ...................3-11
Coarse Loop/YIG Loop Test Procedure......3-12
Fine Loop Test Procedure............3-13
3-8 SPURIOUS SIGNALS TEST ............3-14
Test Setup ...................3-14
0.01 - 2 GHz Test Procedure ..........3-14
0.5 - 2.2 GHz Test Procedure ..........3-17
3-9 HARMONIC TEST: 2 TO 20 GHz..........3-18
Test Setup ...................3-18
Test Procedure (2 to 10 GHz) ..........3-19
Test Procedure (11to 20 GHz) .........3-20
3-10 SINGLE SIDEBAND PHASE NOISE TEST ....3-22
Test Setup ...................3-22
Test Procedure .................3-23
Chapter 3
Performance Verification