Chapter 3

 

Performance Verification

3-1INTRODUCTION

This chapter contains tests that can be used to verify the performance

 

of the Series 682XXB/683XXB Synthesized Signal Generators to speci-

 

fications. These tests support all instrument models having any ver-

 

sion of firmware. Units with Option 2A, 2B, 2C, or 2D (110 dB or

 

90 dB step attenuators), Option 11 (0.1 Hz frequency resolution), and

 

Option 15B (high power output) are also covered.

3-2

3-3

RECOMMENDED TEST

Table 3-1 (page 3-4) provides a list of the recommended test equipment

EQUIPMENT

for the performance verification tests.

 

The test procedures refer to specific test equipment front panel control

 

settings when the test setup is critical to making an accurate meas-

 

urement. In some cases, the user may substitute test equipment hav-

 

ing the same critical specifications as those on the recommended test

 

equipment list.

 

Contact your local ANRITSU service center (refer to Table 1-5 on page

 

1-18) if you need clarification of any equipment or procedural refer-

 

ence.

TEST RECORDS

A blank copy of a sample performance verification test record for each

 

682XXB/683XXB model is provided in Appendix A. Each test record

 

contains the model-specific variables called for by the test procedures.

 

It also provides a means for maintaining an accurate and complete

 

record of instrument performance. We recommend that you copy these

 

pages and use them to record the results of your initial testing of the

 

instrument. These initial test results can later be used as benchmark

 

values for future tests of the same instrument.

3-4CONNECTOR AND KEY

The test procedures include many references to equipment intercon-

LABEL NOTATION

nections and control settings. For all 682XXB/683XXB references, spe-

 

cific labels are used to denote the appropriate menu key, data entry

 

key, data entry control, or connector (such as CW/SWEEP SELECT or

 

RF OUTPUT). Most references to supporting test equipment use gen-

 

eral labels for commonly used controls and connections (such as Span

 

or RF Input). In some cases, a specific label is used that is a particular

 

feature of the test equipment listed in Table 3-1.

682XXB/683XXB MM

3-3

Page 62 Page 64
Page 63
Image 63
Anritsu 683XXB, 682XXB manual 1INTRODUCTION, Recommended Test, Test Records, 4CONNECTOR and KEY, Label Notation
Page 62 Page 64

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
Top Page Image Contents