PERFORMANCE

PULSE MODULATION TEST:

VERIFICATION

RF ON/OFF RATIO

e. Press More to go to the additional Internal Pulse Status Menu display.

g. Press Internal/External to select the external source for the modulation signal. The External Pulse Status Menu is displayed.

h. Press Front/Rear to select the rear panel PULSE TRIGGER IN connector.

i. Press On/Off to turn pulse modulation on.

2. Set up the Spectrum Analyzer as follows:

a. CF: Same as the 682XXB/683XXB CW fre- quency noted in step 1.c.

b. Span/Div: 10 kHz

c. RBW: 1 kHz

d. Video Filter: Wide

e. MIN Noise: Activated

f. Reference Level: Adjust to place the signal at the top graticule of the screen.

3. Connect a short between the 682XXB/683XXB rear panel PULSE TRIGGER IN BNC connector center and outer conductors.

4. On the Spectrum Analyzer, decrease the Refer- ence Level by 20 dB, then measure the signal am- plitude and record it on the Test Record. The measured signal must be ￿60 dB from the top graticule.

NOTE

A 60 dB level change plus a 20 dB decrease in the reference level equals an 80 dB on/off ratio (specification).

5. If the signal level drifts slowly after connecting the short, remove the short momentarily and ap- ply it again. (Make the measurement as soon as possible after applying the short.) This drift is the result of the Sample/Hold circuit not holding the level because of the pulse duty factor (ratio of RF ON to RF OFF). This drift will not be present in normal pulse operation as the minimum pulse repetition rate is 0.597 Hz.

6. Remove the short.

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682XXB/683XXB MM

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Anritsu 682XXB, 683XXB manual Verification RF ON/OFF Ratio
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682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
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