TROUBLESHOOTING

TROUBLESHOOTING

TABLES

Table 5-22.Error Messages 138, 139, 140, and 141 (2 of 2)

Error 139 32-40 GHz SDM Section Failed

Error 140 25-32 GHz SDM Section Failed

Error 141 20-25 GHz SDM Section Failed

Description: Each of these error messages indicates a failure in a switched doubler filter path within the SDM. The 682XXB/683XXB will not produce an RF output in the frequency range of the failed switched doubler filter path.

Step 1. Set up the 682XXB/683XXB as follows:

a.682XXB Setup: CW/SWEEP SELECT: Step F1: 2.000 GHz

F2: 40.000 GHz

Number of Steps: 400

L1: +1.00 dBm

683XXB Setup:

CW/SWEEP SELECT: Analog

F1: 2.000 GHz

F2: 40.000 GHz

Sweep Time: 0.100 Sec

L1: +1.00 dBm

Step 2. Connect the X input of an oscilloscope to the 682XXB/ 683XXB rear panel HORIZ OUT connector.

Step 3. Using the oscilloscope, check the PIN switch drive voltages at A9TP11, A9TP15, and A9TP24 (shown in Table 5-23).

If the PIN switch drive voltages are correct, replace the

qSDM.

If the PIN switch drive voltages are not correct, replace the A9 PCB.

Table 5-23.SDM PIN Switch Drive Voltages

 

Test Point

Active Frequency

Active

Inactive

 

Range

Voltage

Voltage

 

 

 

 

 

 

 

 

A9TP9

0.01 to 20 GHz

+20V

–15V

 

 

 

 

 

 

A9TP11

20 to 25 GHz

+20V

–15V

 

 

 

 

 

 

A9TP15

25 to 32 GHz

+20V

–15V

 

 

 

 

 

 

A9TP24

32 to 40 GHz

+20V

–15V

 

 

 

 

 

 

 

 

 

 

5-50

682XXB/683XXB MM

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Image 216
Anritsu 683XXB manual 682XXB Setup CW/SWEEP Select Step F1 2.000 GHz, Test Point Active Frequency Inactive Range Voltage

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.