SWITCHED FILTER

CALIBRATION

SHAPER CALIBRATION

Log Amplifier Before the Switched Filter Shaper Amplifier can be

Zero Calibra- adjusted, zero calibration of the ALC Log amplifier

tion

must be performed to eliminate any DC offsets.

 

1. Perform ALC Log amplifier zero calibration as

 

follows:

 

a. At the $ prompt on the PC display, type:

 

calterm 115 and press <ENTER>.

 

The $ prompt will appear on the screen when

 

ALC Log amplifier zero calibration is complete.

 

(This can take up to 3 minutes for a 40 GHz

 

unit.)

 

b. Record step completion on the Test Record.

 

NOTE

 

The following Limiter DAC adjustment

 

procedure applies only to 682XXB/

 

683XXBs with Option 15B (High Power

 

Output). If your instrument does not have

 

this option, go directly to the Shaper DAC

 

adjustment procedure.

Limiter DAC

The following steps in the procedure let you adjust

Adjustment

the Switched Filter Limiter DAC which controls the

 

maximum gain of the Switched Filter Shaper Ampli-

 

fier. Each frequency band will be scanned for the

 

maximum unleveled power point before adjustment

 

of the Limiter DAC to ensure that the Shaper Am-

 

plifier is not driven to saturation.

 

1. Set up the 562 Network Analyzer as follows:

 

a. Press the System Menu key.

 

b. From the System Menu display, select RESET.

 

c. Press CHANNEL 2 DISPLAY: OFF.

 

d. Press CHANNEL 1 DISPLAY: ON.

 

e. Press CHANNEL 1 MENU key.

 

f. From the Channel 1 Menu display, select

 

POWER.

 

g. Press OFFSET/RESOLUTION.

 

h. Set Resolution to 5 dB/Div.

 

i. Adjust Offset to center the display.

4-18

682XXB/683XXB MM

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Anritsu 682XXB, 683XXB manual Limiter DAC
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682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
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