TEST

MODEL

RECORD

68297B/68397B

3-8 Spurious Signals Test: RF Output Signals <2 GHz

Test Procedure

Measured Value

Upper Limit

Set F1 to 10 MHz

 

 

Record the presence of the worst case harmonic

_______________dBc

–30 dBc

Record the presence of the worst case non-harmonic

_______________dBc

–40 dBc

Set F1 to 20 MHz

 

 

Record the presence of the worst case harmonic

_______________dBc

–30 dBc

Record the presence of the worst case non-harmonic

_______________dBc

–40 dBc

Set F1 to 30 MHz

 

 

Record the presence of the worst case harmonic

_______________dBc

–30 dBc

Record the presence of the worst case non-harmonic

_______________dBc

–40 dBc

Set F1 to 40 MHz

_______________dBc

–30 dBc

Record the presence of the worst case harmonic

Record the presence of the worst case non-harmonic

_______________dBc

–40 dBc

Set F1 to 350 MHz

 

 

Record the presence of the worst case harmonic

_______________dBc

–40 dBc

Record the presence of the worst case non-harmonic

_______________dBc

–40 dBc

Set F1 to 1.6 GHz

 

 

Record the presence of the worst case non-harmonic

_______________dBc

–40 dBc

Set F1 to 1.6 GHz

 

 

Record the level of the harmonics of the 1.6 GHz carrier:

 

 

3.2 GHz (2nd harmonic)

_______________dBc

–40 dBc

4.8 GHz (3rd harmonic)

_______________dBc

–40 dBc

A-262

682XXB/683XXB MM

Page 500
Image 500
Anritsu manual 262 682XXB/683XXB MM, Spurious Signals Test RF Output Signals 2 GHz

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

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The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

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In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.