PERFORMANCE

FREQUENCY

VERIFICATION

SYNTHESIS TESTS

Fine Loop The following procedure tests the fine loop by step-

Testping the instrument through ten 1 kHz steps (ten

Procedure 100 Hz steps for instruments with Option 11) and measuring the RF output at each step.

1. Set up the 682XXB/683XXB as follows:

a. Reset the instrument by pressing SYSTEM , then Reset . Upon reset, the CW Menu is dis- played.

b. Press Edit F1 to open the current frequency parameter for editing.

c. Set F1 to the first test frequency indicated on the Test Record.

2. Record the Frequency Counter reading on the Test Record. The Frequency Counter reading must be within ￿100 Hz of the displayed 682XXB/ 683XXB frequency (￿10 Hz for instruments with Option 11) to accurately complete this test.

3. On the 682XXB/683XXB, use the cursor control key (diamond-shaped key) to increment F1 to the next test frequency on the Test Record. Record the Frequency Counter reading on the Test Re- cord.

4. Repeat step 3 until all frequencies listed on the Test Record have been recorded.

682XXB/683XXB MM

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Anritsu 683XXB, 682XXB manual Performance Frequency Verification

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.