TROUBLESHOOTING

TROUBLESHOOTING

TABLES

Table 5-18.Error Messages 124, 125, and 126 (2 of 2)

If the RF signal is correct in both frequency and ampli-

qtude throughout the full sweep, go to step 8.

If there is no RF signal for all or part of the sweep or if the amplitude of the RF signal is low, go to step 5.

Step 5. Connect the X input of an oscilloscope to the 682XXB/ 683XXB rear panel HORIZ OUT connector.

Step 6. Using the oscilloscope, check for a –0.2 to –3.5 volt YIG tuning ramp at A13TP10.

qIf the ramp signal is correct, go to step 7.

If the ramp signal is incorrect or not present, replace the A13 PCB.

Step 7. Using the oscilloscope, check for the YIG bias voltages at the test points shown in Table 5-19.

If the YIG bias voltages are correct, replace the YIG-

qtuned oscillator assembly.

If the YIG bias voltages are incorrect, replace the A13 PCB.

Step 8. Run self-test again.

qIf no error message is displayed, the problem is cleared.

If any of the error messages, listed above, are displayed, contact your local ANRITSU service center for assistance.

Table 5-19.YIG-tuned Oscillator Bias Voltages

 

Test Point

YIG-tuned Oscillator Bias Voltages

 

 

2 to 8.4 GHz

 

8.4 to 20 GHz

 

 

 

 

 

 

 

 

 

 

 

 

A13TP3

+6V

 

+6V

 

 

 

 

 

 

 

A13TP5

0V

 

+8V

 

 

 

 

 

 

 

A13TP6

–5V

 

–5V

 

 

 

 

 

 

 

A13TP7

+8V

 

0V

 

 

 

 

 

 

 

 

 

 

 

 

5-40

682XXB/683XXB MM

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Anritsu 682XXB, 683XXB manual A13TP3 +6V A13TP5 +8V A13TP6 A13TP7

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.