PERFORMANCE

SPURIOUS SIGNALS TEST: RF OUTPUT SIGNALS

VERIFICATION

￿2 GHz (￿2.2 GHz for 68XX5B MODELS)

Table 3-3.Spurious Signals Specifications

Harmonic and Harmonic Related:

 

500 MHz to 2.2 GHz (68XX5B):

<–50 dBc

10 MHz to £50 MHz:

<–30 dBc

>50 MHz to £2 GHz:

<–40 dBc

>2 GHz (2.2 GHz for 68XX5B)

 

to £20 GHz:

<–60 dBc

>20 GHz to 40 GHz:

<–40 dBc

Harmonic and Harmonic Related (Models having a high-end frequency of >40 GHz and units with Op- tion 15B at maximum specified leveled output

power):

 

 

500 MHz to 2.2 GHz (68XX5B):

<–50 dBc

10

MHz to £50 MHz:

 

<–30 dBc

>50 MHz to £2 GHz:

 

<–40 dBc

>2 GHz (2.2 GHz for 68XX5B)

 

to £20 GHz:

 

<–50 dBc

>20 GHz to 40 GHz:

 

<–40 dBc

50

GHz units: >40 GHz to

50 GHz:

<–40 dBc

60

GHz units: >40 GHz to

60 GHz:

<–30 dBc

65

GHz units: >40 GHz to £45 GHz:

<–25 dBc

 

>45 GHz to £65 GHz: <–30 dBc

Non-Harmonics:

 

 

500 MHz to £2.2 GHz (68XX5B):

<–50 dBc

10

MHz to £2 GHz:

 

<–40 dBc

>2 GHz (2.2 GHz for 68XX5B)

 

to £65 GHz:

 

<–60 dBc

 

 

 

 

2.Set up the 682XXB/683XXB as follows:

a.Reset the instrument by pressing SYSTEM , then Reset . Upon reset the CW Menu is dis- played.

b.Press Edit L1 to open the current power level parameter for editing.

c.Set L1 to the lesser of +10 dBm or the maxi- mum leveled power level for the instrument being tested (refer to Table 3-2, page 3-6).

d.Press Edit F1 to open the current frequency parameter for editing.

e.Set F1 to 10 MHz.

3.On the Spectrum Analyzer, measure the worst case harmonic and non-harmonic signals for the 10 MHz carrier. Record their presence by enter- ing the levels on the Test Record. Refer to Table 3-3 for the specified level limits.

NOTE

Harmonics appear at multiples of the CW frequency and diminish quickly as the CW frequency gets greater than 1 GHz.

4.Repeat step 3 with F1 set first to 20 MHz, then set to 30 MHz. Measure the worst case harmonics and non-harmonics for each carrier frequency and record their presence by entering their levels on the Test Record.

5.Change the Spectrum Analyzer setup as follows:

a.Span: 100 MHz/div

b.CF: 500 MHz

6.Repeat step 3 with F1 set to 40 MHz. Measure the worst case harmonic and non-harmonic sig- nals for the 40 MHz carrier and record their pres- ence by entering their levels on the Test Record.

7.Change the Spectrum Analyzer setup as follows:

a.Span: 200 MHz/div (or maximum span width)

b.CF: 1 GHz (N/A if at maximum span width)

8.Repeat step 3 with F1 set to 350 MHz. Measure the worst case harmonic and non-harmonic sig- nals for the 350 MHz carrier and record their

682XXB/683XXB MM

3-15

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Anritsu 683XXB, 682XXB Harmonic and Harmonic Related MHz to 2.2 GHz 68XX5B, MHz to £50 MHz, MHz to £2 GHz, GHz to 40 GHz
Page 74 Page 76

682XXB, 683XXB specifications

The Anritsu 683XXB and 682XXB series are advanced vector network analyzers (VNAs) renowned for their precision and versatility in characterizing RF and microwave components. Designed for engineers and technicians involved in the development, manufacturing, and testing of high-frequency devices, these analyzers offer state-of-the-art technology that ensures optimal performance in various applications.

One of the hallmark features of the Anritsu 683XXB and 682XXB is their high dynamic range, which allows for accurate measurements of small reflection and transmission coefficients, essential for assessing the performance of complex RF structures. With frequency coverage extending from DC to 70 GHz, these analyzers cater to a broad spectrum of applications, making them suitable for industries such as telecommunications, aerospace, and automotive.

The user-friendly interface of the Anritsu VNAs is complemented by a high-resolution display, which facilitates easy navigation through measurement setups and results. The analyzers feature multiple measurement modes, including S-parameter measurements, time-domain analysis, and noise figure measurements, providing engineers with comprehensive tools for device characterization.

Both the 683XXB and 682XXB implement advanced calibration techniques, including automated calibration and error correction methods, to enhance measurement accuracy. These methods significantly reduce the uncertainties associated with test setups, enabling reliable performance evaluations of components like filters, amplifiers, and antennas.

Anritsu’s proprietary technologies, such as the VectorStar and ShockLine series integration, further empower the 683XXB and 682XXB models. These technologies enable high-throughput testing and improved measurement stability, addressing the needs of modern production environments that demand rapid turnaround times without sacrificing precision.

Additionally, the analyzers come equipped with various connectivity options, including USB, LAN, and GPIB, ensuring seamless integration into automated test systems. This adaptability enhances the analyzers' utility in both laboratory settings and field operations.

In conclusion, the Anritsu 683XXB and 682XXB series vector network analyzers represent the pinnacle of RF and microwave testing technology. With their unmatched precision, comprehensive measurement capabilities, and advanced calibration techniques, these instruments are indispensable tools for professionals striving to push the boundaries of high-frequency device performance and reliability.
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