Sun Microsystems 220R service manual EBus DMA/TCR Registers, Test Function

Test	Function
line_walk1	Performs walk-one test on interrupt line.
pin_test	Verifies that the interrupt pin is logic-level high (1) after reset.

The following example shows the PCI/Cheerio diagnostic output message.

Enter (0-11 tests, 12 -Quit, 13 -Menu) ===> 0 Test

vendor_ID_test device_ID_test mixmode_read

e2_class_test status_reg_walk1 line_size_walk1 latency_walk1 line_walk1 pin_test SUBTEST='pin_test'

Enter (0-11 tests, 12 -Quit, 13 -Menu) ===>

7.6.4EBus DMA/TCR Registers

The EBus DMA/TCR registers diagnostic performs the following tests.

Test	Function
DMA_reg_test	Performs a walking ones bit test for control status register, address
	register, and byte count register of each channel. Verifies that the control
	status register is set properly.

DMA_func_test Validates the DMA capabilities and FIFOs. Test is executed in a DMA diagnostic loopback mode. Initializes the data of transmitting memory

with its address, performs a DMA read and write, and verifies that the data received is correct. Repeats for four channels.

The following example shows the EBus DMA/TCR registers diagnostic output message.

198 Sun Enterprise 220R Server Service Manual ♦ January 2000, Revision A