Toshiba S500M manual Detail of Each Test Function System Test, Memory test

Tests and Diagnostics

3.35.6 Detail of Each Test Function

3.35.6.1 System Test

1) DMI data read

This subtest displays the information in the Flash-ROM in the following format

Model Name ：	XXXXXXXX
Version Number ：	XXXXXXXX
Serial Number ：	XXXXXXXX
Model Number ：	XXXXXXXX
PCN/BND	XXXXXXXX
Number ：
UUID Number ：	XXXXXXXXXXXXXXX

3.35.6.2 Memory test

1) Conventional memory test

This subtest writes a constant data to conventional memory (0 to 640 KB), then reads the new data and compares the result with the original data.

With regard to the test memory content, save the data to the test memory before the test and restore it after the test.

Details of Test:

1-1) This subtest performs a test data write/read/compare operation to the work memory (640KB from 0000:0000 to 9000:FFFF) in the real mode. The test procedure is as follows:

Step 1: Byte Enable Test

Write double words of the data to the initial address of the data in 64KB units and the initial address + 4, then read the written data byte by byte and compare the result with the original data.

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3-158 [CONFIDENTIAL]) TECRA M11/Satellite Pro S500M Series Maintenance Manual (960-813)