Samsung S3F80JB manual TM Test Under Mask, TMdst,src, Operation dst and src, Always reset to

Models: S3F80JB

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S3F80JBINSTRUCTION SET

TM — Test Under Mask

TMdst,src

Operation: dst AND src

This instruction tests selected bits in the destination operand for a logic zero value. The bits to be tested are specified by setting a "1" bit in the corresponding position of the source operand (mask), which is ANDed with the destination operand. The zero (Z) flag can then be checked to determine the result. The destination and source operands are unaffected.

Flags:

C:

Unaffected.

 

Z:

Set if the result is "0"; cleared otherwise.

 

S:

Set if the result bit 7 is set; cleared otherwise.

 

V:

Always reset to "0".

 

D:

Unaffected.

 

H:

Unaffected.

Format:

 

 

 

Bytes Cycles

Opcode

Addr Mode

 

(Hex)

dst

src

opc

dst src

 

 

 

 

opc

src

dst

2

4

72

r

r

 

6

73

r

lr

3

6

74

R

R

 

6

75

R

IR

opc

dst

src

3

6

76

R

IM

Examples: Given: R0 = 0C7H, R1 = 02H, R2 = 18H, register 00H = 2BH, register 01H = 02H, and register 02H = 23H:

TM

R0,R1

R0

= 0C7H, R1 = 02H, Z = "0"

TM

R0,@R1

R0

= 0C7H, R1 = 02H, register 02H = 23H, Z = "0"

TM

00H,01H

Register 00H

= 2BH, register 01H = 02H, Z = "0"

TM

00H,@01H

Register 00H

= 2BH, register 01H = 02H,

 

 

 

register 02H

= 23H, Z = "0"

TM

00H,#54H

Register 00H

= 2BH, Z = "1"

In the first example, if working register R0 contains the value 0C7H (11000111B) and register R1 the value 02H (00000010B), the statement "TM R0,R1" tests bit one in the destination register for a "0" value. Because the mask value does not match the test bit, the Z flag is cleared to logic zero and can be tested to determine the result of the TM operation.

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Samsung S3F80JB manual TM Test Under Mask, TMdst,src, Operation dst and src, Always reset to