Samsung manual When Test PIN = 1VDD, ¾ When S3F80JB

Models: S3F80JB

1 346
Download 346 pages 34.13 Kb
Page 345
Image 345

Important Note

S3F80JB

 

 

3. DIFFERENCE S3F80JB AND S3F80J9

3.1 WHEN TEST PIN = “1(VDD)”

This is Fabrication Test mode (For Design team & PE ) : Design team & PE team tested S3F80JB by using ADVAN equipment When testing S3F80JB, port1.0~1.7 is set to address port and data port for chip test.

So, output disable signal of Port1.0~1.7 is toggling to Input/Output mode.

¾When S3F80JB

Port1.0~1.7 is used to address & data port between Advan equipment and S3F80JB. When Advan equipment sends data to S3F80JB, port1.0~1.7 is input mode. And when Advan equipment receives next address to S3F80JB, port1.0~1.7 is output mode. I.e, port1.0~1.7 is toggling to Input/Output mode during chip test.

3

Page 345
Image 345
Samsung manual When Test PIN = 1VDD, ¾ When S3F80JB