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Chapter 7: ML561 Hardware-Simulation Correlation
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illustrated here for these signals can be easily adopted to perform SI analysis for any other memory interface signal on the ML561 board.
This chapter presents the SI results for the following six data bit signals:
•DDR2 component DQ bit (DDR2_DQ_BY2_B3) for write operations
•DDR2 component DQ bit (DDR2_DQ_BY2_B3) for read operations
•DDR2 DIMM DQ bit (DDR2_DIMM_DQ_BY2_B3) for write operations
•DDR2 DIMM DQ bit (DDR2_DIMM_DQ_BY2_B3) for read operations
•QDRII D bit (QDR2_D_BY0_B5) for write operations
•QDRII Q bit (QDR2_Q_BY0_B5) for read operations
Test Setup
Hardware measurements were performed for the six specific signal nets, and then signal integrity (SI) simulations were performed for correlation and extrapolation. The test setup consisted of the following hardware equipment, simulation software tools, the stimulus test pattern, and test criteria for determining the quality of signals. The test bench is designed so that the test pattern is applied only to the signal under test, and all other data bits to the same memory interface are kept in a quiet Low state. This setup ensures that the hardware measurement is not altered due to any simultaneous switching output (SSO) effect.
•Hardware measurement equipment
♦Agilent DSO80604B 6 GHz oscilloscope
♦Agilent 1131A 3.5 GHz Infiniimax probe amplifier
♦Agilent E2675A (Differential browser) or E2677A (Differential
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♦SRS Model CG635 Synthesized Clock Generator for low jitter clock source
•Simulation software
♦Mentor Graphics HyperLynx EXT, Version 7.5 with LineSim and BoardSim features
♦Xilinx
♦ML561, Rev B layout file: ML561_B_041706.hyp
♦Micron
♦Micron
♦Molex DDR2 DIMM socket specification (P/N
♦Samsung QDRII HSTL 1.8V IBIS model
♦IBISWriter Utility of ISE software suite to create customized IBIS model of the FPGA1 (U7) and FPGA3 (U34) devices on the ML561 board: Model files ml561_fpga1_u7.ibs and ml561_fpga3_u34.ibs. (See “How to Generate a
•Stimulus
Pseudo Random Bit Stream (PRBS) is accepted as the most effective test pattern to measure the quality of data signals because, unlike the periodic signals like clock and
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| UG199 (v1.2) April 19, 2008 |