Test Sample Chromatograms
Test sample chromatograms
Test sample chromatograms
Figure
HP 5890 Test Sample Operating
Conditions
Detector Type FID (or FIDw/MUG)
Temp 250 DEGREES C
Inlet Type PACKED (OR PURGED
PACKED).
Temp 200 DEGREES C
Operating Mode |
| N/A |
| ||
Purge Time On |
| N/A | min | ||
Purge Time Off |
| N/A | min | ||
Oven Temp Programmed (1 ramp) | |||||
Init Temp | 110 | DEGREES C | |||
Init Time | 0 | min | |||
Ramp |
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Rate |
| 15 |
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Fin Temp |
|
| 150 |
|
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Fin Time |
| 1 |
|
| |
Range 8 |
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COLUMN: |
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Part No. | 19095(#100) | ||||
Dimensions |
|
| 530¿ MID; 5 M | ||
Sta Phase | Methyl Silicone | ||||
START
FLOW RATES |
|
|
|
Carrier (He) | 20 | +/• 1 | ml/min |
Hydrogen | 33 | +/• 1 | ml/min |
Air | 400 | +/• 20 | ml/min |
Makeup (N2) | 10 | +/• 1 | ml/min |
Split Vent |
| N/A | ml/min |
Septum Purge |
| 1•2 | ml/min |
SAMPLE:
Type FID Sample
Inj Volume 1 ¿l Part No. 18710•60170 Composition 0.03%(V/V)each
C14,C15,C16 normal paraffin hydrocarbons in hexane
32
1.41C14
1.95C15
2.55C16
Flame Ionization Detector (FID)
225