Test Sample Chromatograms

Test sample chromatograms

Figure 10-11.

HP 5890 Test Sample Operating

Conditions

Detector Type

TCDw/MUG

 

Temp 300 DEGREES C

Inlet Type Ded On-Col

 

Oven Track

 

 

On

 

 

Temp N/A

C

Operating Mode

 

N/A

 

Purge Time On

 

N/A

min

Purge Time Off

 

N/A

min

Oven Temp Programmed (1 ramp)

Init Temp

60

DEGREES C

Init Time

0.5

min

Ramp

 

 

 

 

 

 

Rate

 

 

20

 

 

Fin Temp

 

 

180

 

 

Fin Time

 

 

1

 

 

Flow Param (EPP)

 

Constant Flow

Off

Range

0

 

 

 

 

 

COLUMN:

 

 

 

 

 

 

Part No.

 

19095S(#100)

Dimensions

 

 

530¿ MID; 5 M

Sta Phase

Methyl Silicone

FLOW RATES

 

 

Carrier (He)

20 +/• 1

ml/min

Hydrogen

N/A

ml/min

Air

N/A

ml/min

Makeup (He)

5+/•1

ml/min

Split Vent

N/A

ml/min

Septum Purge

5+/•1

ml/min

Reference (He) 37+/•1

ml/min

SAMPLE:

Type FID Sample

Inj Volume 3 ¿l Part No. 18710•60170 Composition 0.03%(V/V)each C14,C15,C16 normal paraffin hydrocarbons in hexane.

4.23 C14

4.82 C15

5.38 C16

TCD-On-Column Capillary Inlet

235