Recommended Test Equipment | Agilent Technologies 01664-97005

General Information

Recommended Test Equipment

Recommended Test Equipment

Equipment Required

Equipment	Critical Specifications		Recommended	Use*
			Model/Part
Pulse Generator	100 MHz, 3.5 ns pulse width,		Agilent 8131A Option 020 P,T
Digitizing Oscilloscope	< 600 ps rise time		Agilent 54121T	P
Digitizing Oscilloscope	≥ 6 GHz bandwidth, < 58 ps rise time		Agilent 54121T	P
Function Generator	Accuracy ≤ (5)(10−6) × frequency,		Agilent 3325B Option 002 P
	DC offset voltage ±6.3 V
Digital Multimeter	0.1 mV resolution, 0.005% accuracy		Agilent 3458A	P
BNC-Banana Cable			Agilent 11001-60001	P
BNC Tee	BNC (m)(f)(f)		Agilent 1250-0781	P
Cable	BNC (m)(m) 48 inch > 2GHz bandwidth		Agilent 8120-1840	P,T
SMA Coax Cable (Qty 3)	18 GHz bandwidth		Agilent 8120-4948	P
Adapter (Qty 4)	SMA(m)-BNC(f)		Agilent 1250-1200	P, T
Adapter	SMA(f)-BNC(m)		Agilent 1250-2015	P
Coupler (Qty 4)	BNC (m)(m)		Agilent 1250-0216	P, T
20:1 Probes (Qty 2)			Agilent 54006A	P
BNC Test Connector, 17x2				P
(Qty 1)**				P,T
BNC Test Connector, 6x2				P,T
(Qty 4)**
Digitizing Oscilloscope	> 100 MHz Bandwidth		Agilent 54600A	T
BNC Shorting Cap			Agilent 1250-0074	T
BNC-Banana Adapter			Agilent 1251-2277	T
Light Power Meter			United Detector 351	A
Alignment Tool			8710-1300	A
*A = Adjustment P = Performance Tests		T = Troubleshooting

**Instructions for making these test connectors are in chapter 3, "Testing Performance."

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Agilent Technologies 01664-97005 manual Recommended Test Equipment, Equipment Required

Contents

Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer This Book Table of Contents Contents To adjust the CRT intensityTo test the time interval accuracy Self-Tests Description Gpib Optional RS-232COptional Centronix Viii General Information Accessories Accessories Supplied Part Number QtyAccessories Available Accessories Available Part Number Specifications Supplemental Characteristics ProbesState Analysis Timing Analysis Indicators Measurement and Display FunctionsMeasurement Functions Data Entry/Display Auxiliary Power DimensionsMarker Functions Operating Environment Product Regulations EMC Recommended Test Equipment Recommended Test EquipmentEquipment Required Preparing for Use Check the supplied accessories To inspect the logic analyzerInspect the shipping container for damage Inspect the product for physical damage Ferrites Ferrites To apply power To apply powerTo operate the user interface To set the line voltage To clean the logic analyzer To degauss the displayTo test the logic analyzer To degauss the displayPage Testing Performance Testing Performance To perform the self-tests Select the Front Panel Test To perform the self-tests Select the Display Test To make the test connectors Materials Required To make the test connectors Set up the equipment To test the threshold accuracy Connect the logic analyzer Set up the logic analyzerTo test the threshold accuracy Test the TTL threshold To test the threshold accuracy Test the ECL threshold Test the − User threshold Test the + User threshold Test the 0 V User threshold Test the next pod Pulse Generator Setup Set up the pulse generatorTo test the glitch capture Oscilloscope Setup Set up the oscilloscopeTo test the glitch capture Connect the Logic Analyzer to the Pulse Generator Test the glitch capture on the connected channels Set up the Waveform menu to view all the channels Test the next channels To test the single-clock, single-edge, state acquisition To test the single-clock, single-edge, state acquisition Set up the Format menu Set up the Trigger menu Connect the 1664A Logic Analyzer to the Pulse Generator Verify the test signal To test the single-clock, single-edge, state acquisition Select the logic analyzer setup/hold time Check the setup/hold combinationSetup/Hold Combinations Select the clock to be tested Clocks To test the single-clock, single-edge, state acquisition Select the clock to be tested Test the next setup/hold combination To test the multiple-clock, multiple-edge, state acquisition To test the multiple-clock, multiple-edge, state acquisition Set up the Format menu Pod 1, channel Verify the test signal To test the multiple-clock, multiple-edge, state acquisition 0.0 ns 4.5 ns 2.5 ns Select the clocks to be tested To test the multiple-clock, multiple-edge, state acquisition Select the clocks to be tested Hen continue through the complete test Set up the pulse generator according to the following table To test the single-clock, multiple-edge, state acquisition To test the single-clock, multiple-edge, state acquisition Set up the Format menu Channel Verify the test signal To test the single-clock, multiple-edge, state acquisition These procedures Logic analyzer Format menu, select Master Clock Oscilloscope Timebase Delay Test the next clock To test the time interval accuracy EXT Trig Function Generator Setup To test the time interval accuracy Set up the Format menu Set up the Waveform menu. a Press the Waveform key Acquire the data Performance Test Record Performance Test Record 1664A Logic Analyzer Performance Test Record Calibrating and Adjusting Calibrating and Adjusting Logic analyzer calibration To adjust the CRT monitor alignment Cause personal injury To adjust the CRT monitor alignment Enter the Sys PV tests, then enter the Display Test To adjust the CRT intensity Press the front panel Select key To adjust the CRT intensity Troubleshooting Troubleshooting To use the flowcharts Troubleshooting To use the flowcharts Troubleshooting Troubleshooting Troubleshooting To use the flowcharts To use the flowcharts Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting To check the power-up tests To check the power-up testsAs the tests complete, check if they pass or fail Select the Chip 5 Tests menu and press the Select key To run the self-testsTo run the self-tests To run the self-tests To run the self-tests Select the Front Panel Test To run the self-tests To test the power supply voltages To test the power supply voltagesLoad the +5.00 V supply with a 2 Ω, 25 watt resistor Loaded by the acquisition board Signals on the Power Supply Cable To test the CRT monitor signals To test the CRT monitor signalsCRT Monitor Cable Signals To test the keyboard signals Turn off the instrument and remove the power cableTo test the keyboard signals Keyboard Connector Signals To test the disk drive voltages To test the disk drive voltages Pin Signal Description Disk Drive Voltages To perform the BNC test Press the Config key Assign pods 1 and 2 to MachineTo perform the BNC test To test the logic analyzer probe cables Set up the logic analyzer Configuration menuTo test the logic analyzer probe cables Set up the Format menu. a Press the Format key Select Clear Trigger, then select All Return to the troubleshooting flowchart To test the auxiliary power To test the auxiliary power Replacing Assemblies Replacing Assemblies Exploded View Listing Replacing Assemblies Reverse this procedure to install the cover To remove and replace the handleTo remove and replace the feet and tilt stand To remove and replace the cover Using previous procedures, remove the following assemblies Reverse this procedure to install the disk driveTo remove and replace the disk drive To remove and replace the disk drive To remove and replace the power supply To remove and replace the power supplyTo remove and replace the Main Circuit board Verify the push-on, push-off action of the assembly To remove and replace the switch actuator assemblyTo remove and replace the switch actuator assembly To remove and replace the rear panel assembly To remove and replace the rear panel assembly To remove and replace the front panel and keyboard To remove and replace the intensity adjustmentTo remove and replace the front panel and keyboard Reverse this procedure to install the handle plate To remove and replace the monitorTo remove and replace the handle plate To remove and replace the monitor To remove and replace the line filter To remove and replace the fanTo remove and replace the fan To remove and replace the optional Gpib and RS-232C cables Remove accessories from the logic analyzer To return assembliesPackage the logic analyzer Seal the shipping container securely, and mark it Fragile Replaceable Parts Parts listed Replaceable Parts OrderingParts not listed Direct mail order system Exploded View Exploded View Replaceable Parts List Replaceable Parts List Replaceable Parts List 1664A Replaceable Parts Agilent Des Part Qty Description Number MP1 RS-232 loopback connector Power Cables and Plug Configurations Power Cables and Plug Configurations Theory of Operation Theory of Operation Block-Level Theory 1664A Logic Analyzer 1664A Theory System MemoryCRT Controller and Display RAM Disk Drive Controller CRT Monitor Assembly Power SupplyExternal Keyboard Interface Centronix Interface Theory of Operation Logic Acquisition Circuitry Comparators Main Circuit Board Logic Acquisition Theory ProbingAcquisition Threshold Test and Clock Synchronization Circuit Self-Tests Description Power-up Self-TestsROM Test System Tests System PV System Tests System PVRAM Test Interrupt Test Gpib Test RS-232C TestHIL Test Disk Test Front Panel Test Perform Test AllDisplay Test Analyzer Tests Analy PV Analyzer Tests Analy PVBoard Test Chip Tests Data Input Inspection Gpib Optional RS-232C Signal Definitions RS-232COptional Centronix Signal Definitions CentronixPage Declaration of Conformity Page Document Warranty Product Warranty