Agilent Technologies 01664-97005 To test the multiple-clock, multiple-edge, state acquisition

Testing Performance

To test the multiple-clock, multiple-edge, state acquisition

cIn the oscilloscope Measure menu, select Measure Chan 2, then select Period. If the period is more than or equal to 20.000 ns, go to step 4. If the period is less than 20.000 ns but greater than 19.75 ns, go to step 3.

dIn the oscilloscope Timebase menu, add 10 ns to the Delay.

eIn the oscilloscope Measure menu, select Period. If the period is more than or equal to 20.000 ns, decrease the pulse generator Chan 2 DOUB in 100 ps increments until one of the two periods measured is less than 20.000 ns but greater than 19.75 ns.

3Check the data pulse width. Using the oscilloscope verify that the data pulse width is 4.450 ns, +50 ps or −100 ps.

a In the oscilloscope Timebase menu, select Sweep Speed 1.00 ns/div.

b Select Delay. Using the oscilloscope knob, position the data waveform so that the waveform is centered in the screen.

cIn the oscilloscope Delta V menu, set the Marker 1 Position to Chan 1, then set Marker 1 at −1.3000 V. Set the Marker 2 Position to Chan 1, then set Marker 2 at −1.3000 V.

dIn the oscilloscope Delta T menu, select Start On Pos Edge 1. Select Stop on Neg Edge 1.

eIf the pulse width is outside of the limits, adjust the pulse generator channel 1 width and select the oscilloscope Precision Edge Find until the pulse width is within limits.

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