Select the Display Test | Agilent Technologies 01664-97005 specification

Testing Performance

To perform the self-tests

11Select the Display Test.

A white grid pattern is displayed. These display screens are not normally used, but can be used to adjust the display. Refer to chapter 4, "Calibrating and Adjusting" for display adjustments.

a Select Continue and the screen changes to full bright. b Select Continue and the screen changes to half bright.

c Select Continue and the test screen shows the Display Test status changed to Tested.

12Record the results of the tests on the performance test record at the end of this chapter.

13To exit the test system, press the System key, then select Exit Test in the pop-up menu and press the Select key. Reinstall the disk containing the operating system, then select Exit Test System and press the Select key.

3–5

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Agilent Technologies 01664-97005 manual Select the Display Test

Contents

Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer This Book Table of Contents To adjust the CRT intensity ContentsTo test the time interval accuracy Gpib Optional RS-232COptional Centronix Self-Tests Description Viii General Information Accessories Available Part Number AccessoriesAccessories Supplied Part Number Qty Accessories Available Specifications Timing Analysis Supplemental CharacteristicsProbes State Analysis Data Entry/Display IndicatorsMeasurement and Display Functions Measurement Functions Operating Environment Auxiliary PowerDimensions Marker Functions EMC Product Regulations Recommended Test Equipment Recommended Test EquipmentEquipment Required Preparing for Use Inspect the product for physical damage Check the supplied accessoriesTo inspect the logic analyzer Inspect the shipping container for damage Ferrites Ferrites To set the line voltage To apply powerTo apply power To operate the user interface To degauss the display To clean the logic analyzerTo degauss the display To test the logic analyzerPage Testing Performance Testing Performance To perform the self-tests To perform the self-tests Select the Front Panel Test Select the Display Test Materials Required To make the test connectors To make the test connectors To test the threshold accuracy Set up the equipment Set up the logic analyzer Connect the logic analyzerTo test the threshold accuracy Test the TTL threshold To test the threshold accuracy Test the ECL threshold Test the − User threshold Test the + User threshold Test the 0 V User threshold Test the next pod Set up the pulse generator Pulse Generator SetupTo test the glitch capture Set up the oscilloscope Oscilloscope SetupTo test the glitch capture Connect the Logic Analyzer to the Pulse Generator Test the glitch capture on the connected channels Set up the Waveform menu to view all the channels Test the next channels To test the single-clock, single-edge, state acquisition To test the single-clock, single-edge, state acquisition Set up the Trigger menu Set up the Format menu Connect the 1664A Logic Analyzer to the Pulse Generator Verify the test signal To test the single-clock, single-edge, state acquisition Check the setup/hold combination Select the logic analyzer setup/hold timeSetup/Hold Combinations Clocks Select the clock to be tested To test the single-clock, single-edge, state acquisition Select the clock to be tested Test the next setup/hold combination To test the multiple-clock, multiple-edge, state acquisition To test the multiple-clock, multiple-edge, state acquisition Set up the Format menu Pod 1, channel Verify the test signal To test the multiple-clock, multiple-edge, state acquisition 0.0 ns 4.5 ns 2.5 ns Select the clocks to be tested To test the multiple-clock, multiple-edge, state acquisition Select the clocks to be tested Hen continue through the complete test To test the single-clock, multiple-edge, state acquisition Set up the pulse generator according to the following table To test the single-clock, multiple-edge, state acquisition Set up the Format menu Channel Verify the test signal To test the single-clock, multiple-edge, state acquisition Logic analyzer Format menu, select Master Clock These procedures Oscilloscope Timebase Delay Test the next clock EXT Trig To test the time interval accuracy To test the time interval accuracy Function Generator Setup Set up the Format menu Set up the Waveform menu. a Press the Waveform key Acquire the data Performance Test Record 1664A Logic Analyzer Performance Test Record Performance Test Record Calibrating and Adjusting Logic analyzer calibration Calibrating and Adjusting Cause personal injury To adjust the CRT monitor alignment Enter the Sys PV tests, then enter the Display Test To adjust the CRT monitor alignment Press the front panel Select key To adjust the CRT intensity To adjust the CRT intensity Troubleshooting To use the flowcharts Troubleshooting To use the flowcharts Troubleshooting Troubleshooting Troubleshooting Troubleshooting To use the flowcharts To use the flowcharts Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting To check the power-up tests To check the power-up testsAs the tests complete, check if they pass or fail To run the self-tests Select the Chip 5 Tests menu and press the Select keyTo run the self-tests To run the self-tests To run the self-tests Select the Front Panel Test To run the self-tests Loaded by the acquisition board To test the power supply voltagesTo test the power supply voltages Load the +5.00 V supply with a 2 Ω, 25 watt resistor Signals on the Power Supply Cable To test the CRT monitor signals To test the CRT monitor signalsCRT Monitor Cable Signals Keyboard Connector Signals To test the keyboard signalsTurn off the instrument and remove the power cable To test the keyboard signals To test the disk drive voltages To test the disk drive voltages Disk Drive Voltages Pin Signal Description Press the Config key Assign pods 1 and 2 to Machine To perform the BNC testTo perform the BNC test Set up the logic analyzer Configuration menu To test the logic analyzer probe cablesTo test the logic analyzer probe cables Set up the Format menu. a Press the Format key Select Clear Trigger, then select All Return to the troubleshooting flowchart To test the auxiliary power To test the auxiliary power Replacing Assemblies Replacing Assemblies Listing Exploded View Replacing Assemblies To remove and replace the cover Reverse this procedure to install the coverTo remove and replace the handle To remove and replace the feet and tilt stand To remove and replace the disk drive Using previous procedures, remove the following assembliesReverse this procedure to install the disk drive To remove and replace the disk drive To remove and replace the power supply To remove and replace the power supplyTo remove and replace the Main Circuit board To remove and replace the switch actuator assembly Verify the push-on, push-off action of the assemblyTo remove and replace the switch actuator assembly To remove and replace the rear panel assembly To remove and replace the rear panel assembly To remove and replace the intensity adjustment To remove and replace the front panel and keyboardTo remove and replace the front panel and keyboard To remove and replace the monitor Reverse this procedure to install the handle plateTo remove and replace the monitor To remove and replace the handle plate To remove and replace the fan To remove and replace the line filterTo remove and replace the fan To remove and replace the optional Gpib and RS-232C cables Seal the shipping container securely, and mark it Fragile Remove accessories from the logic analyzerTo return assemblies Package the logic analyzer Replaceable Parts Direct mail order system Parts listedReplaceable Parts Ordering Parts not listed Exploded View Exploded View Replaceable Parts List Replaceable Parts List Agilent Des Part Qty Description Number Replaceable Parts List 1664A Replaceable Parts MP1 RS-232 loopback connector Power Cables and Plug Configurations Power Cables and Plug Configurations Theory of Operation Theory of Operation 1664A Logic Analyzer Block-Level Theory Disk Drive Controller 1664A TheorySystem Memory CRT Controller and Display RAM Centronix Interface CRT Monitor AssemblyPower Supply External Keyboard Interface Logic Acquisition Circuitry Theory of Operation Main Circuit Board Logic Acquisition Theory Probing ComparatorsAcquisition Test and Clock Synchronization Circuit Threshold Power-up Self-Tests Self-Tests DescriptionROM Test Interrupt Test System Tests System PVSystem Tests System PV RAM Test Disk Test Gpib TestRS-232C Test HIL Test Perform Test All Front Panel TestDisplay Test Chip Tests Analyzer Tests Analy PVAnalyzer Tests Analy PV Board Test Data Input Inspection Gpib Optional RS-232COptional RS-232C Signal Definitions Centronix Centronix Signal DefinitionsPage Declaration of Conformity Page Document Warranty Product Warranty