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Agilent Technologies 01664-97005 manual Check the setup/hold combination, Setup/Hold Combinations

Models: 01664-97005

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Testing Performance

To test the single-clock, single-edge, state acquisition

Check the setup/hold combination

1Select the logic analyzer setup/hold time.

a In the logic analyzer Format menu, select Master Clock.

b Select the Setup/Hold field, then select the setup/hold combination to be tested for all pods. The first time through this test, use the top combination in the following table.

Setup/Hold Combinations

3.5/0.0 ns

0.0/3.5 ns

1.5/2.0 ns

cSelect Done to exit the setup/hold combinations.

2Disable the pulse generator channel 2 COMP (with the LED off).

3Using the Delay mode of the pulse generator channel 1, position the pulses according to the setup time of the setup/hold combination selected, +0.0 ps or −100 ps.

a In the oscilloscope Delta V menu, set the Marker 1 Position to Chan 1, then set Marker 1 at −1.3000 V. Set the Marker 2 Position to Chan 2, then set Marker 2 at −1.3000 V.

b In the oscilloscope Delta T menu, select Start on Pos Edge 1. Select Stop on Pos Edge 1.

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Agilent Technologies 01664-97005 manual Check the setup/hold combination, Select the logic analyzer setup/hold time

Contents

Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer This Book Table of Contents To adjust the CRT intensity ContentsTo test the time interval accuracy Gpib Optional RS-232COptional Centronix Self-Tests DescriptionViii General Information Accessories Available Part Number AccessoriesAccessories Supplied Part Number Qty Accessories AvailableSpecifications Timing Analysis Supplemental CharacteristicsProbes State AnalysisData Entry/Display IndicatorsMeasurement and Display Functions Measurement FunctionsOperating Environment Auxiliary PowerDimensions Marker FunctionsEMC Product RegulationsRecommended Test Equipment Recommended Test EquipmentEquipment Required Preparing for Use Inspect the product for physical damage Check the supplied accessoriesTo inspect the logic analyzer Inspect the shipping container for damageFerrites FerritesTo set the line voltage To apply powerTo apply power To operate the user interfaceTo degauss the display To clean the logic analyzerTo degauss the display To test the logic analyzerPage Testing Performance Testing Performance To perform the self-tests To perform the self-tests Select the Front Panel TestSelect the Display Test Materials Required To make the test connectorsTo make the test connectors To test the threshold accuracy Set up the equipmentSet up the logic analyzer Connect the logic analyzerTo test the threshold accuracy Test the TTL threshold To test the threshold accuracy Test the ECL threshold Test the − User threshold Test the + User threshold Test the 0 V User threshold Test the next pod Set up the pulse generator Pulse Generator SetupTo test the glitch capture Set up the oscilloscope Oscilloscope SetupTo test the glitch capture Connect the Logic Analyzer to the Pulse Generator Test the glitch capture on the connected channels Set up the Waveform menu to view all the channels Test the next channels To test the single-clock, single-edge, state acquisition To test the single-clock, single-edge, state acquisition Set up the Trigger menu Set up the Format menuConnect the 1664A Logic Analyzer to the Pulse Generator Verify the test signal To test the single-clock, single-edge, state acquisition Check the setup/hold combination Select the logic analyzer setup/hold timeSetup/Hold Combinations Clocks Select the clock to be testedTo test the single-clock, single-edge, state acquisition Select the clock to be tested Test the next setup/hold combination To test the multiple-clock, multiple-edge, state acquisition To test the multiple-clock, multiple-edge, state acquisition Set up the Format menu Pod 1, channel Verify the test signal To test the multiple-clock, multiple-edge, state acquisition 0.0 ns 4.5 ns 2.5 ns Select the clocks to be tested To test the multiple-clock, multiple-edge, state acquisition Select the clocks to be tested Hen continue through the complete test To test the single-clock, multiple-edge, state acquisition Set up the pulse generator according to the following tableTo test the single-clock, multiple-edge, state acquisition Set up the Format menu Channel Verify the test signal To test the single-clock, multiple-edge, state acquisition Logic analyzer Format menu, select Master Clock These proceduresOscilloscope Timebase Delay Test the next clock EXT Trig To test the time interval accuracyTo test the time interval accuracy Function Generator SetupSet up the Format menu Set up the Waveform menu. a Press the Waveform key Acquire the data Performance Test Record 1664A Logic Analyzer Performance Test RecordPerformance Test Record Calibrating and Adjusting Logic analyzer calibration Calibrating and AdjustingCause personal injury To adjust the CRT monitor alignmentEnter the Sys PV tests, then enter the Display Test To adjust the CRT monitor alignmentPress the front panel Select key To adjust the CRT intensityTo adjust the CRT intensity Troubleshooting To use the flowcharts TroubleshootingTo use the flowcharts TroubleshootingTroubleshooting Troubleshooting Troubleshooting To use the flowcharts To use the flowcharts Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting To check the power-up tests To check the power-up testsAs the tests complete, check if they pass or fail To run the self-tests Select the Chip 5 Tests menu and press the Select keyTo run the self-tests To run the self-tests To run the self-tests Select the Front Panel Test To run the self-tests Loaded by the acquisition board To test the power supply voltagesTo test the power supply voltages Load the +5.00 V supply with a 2 Ω, 25 watt resistorSignals on the Power Supply Cable To test the CRT monitor signals To test the CRT monitor signalsCRT Monitor Cable Signals Keyboard Connector Signals To test the keyboard signalsTurn off the instrument and remove the power cable To test the keyboard signalsTo test the disk drive voltages To test the disk drive voltagesDisk Drive Voltages Pin Signal DescriptionPress the Config key Assign pods 1 and 2 to Machine To perform the BNC testTo perform the BNC test Set up the logic analyzer Configuration menu To test the logic analyzer probe cablesTo test the logic analyzer probe cables Set up the Format menu. a Press the Format key Select Clear Trigger, then select All Return to the troubleshooting flowchart To test the auxiliary power To test the auxiliary powerReplacing Assemblies Replacing Assemblies Listing Exploded ViewReplacing Assemblies To remove and replace the cover Reverse this procedure to install the coverTo remove and replace the handle To remove and replace the feet and tilt standTo remove and replace the disk drive Using previous procedures, remove the following assembliesReverse this procedure to install the disk drive To remove and replace the disk driveTo remove and replace the power supply To remove and replace the power supplyTo remove and replace the Main Circuit board To remove and replace the switch actuator assembly Verify the push-on, push-off action of the assemblyTo remove and replace the switch actuator assembly To remove and replace the rear panel assembly To remove and replace the rear panel assemblyTo remove and replace the intensity adjustment To remove and replace the front panel and keyboardTo remove and replace the front panel and keyboard To remove and replace the monitor Reverse this procedure to install the handle plateTo remove and replace the monitor To remove and replace the handle plateTo remove and replace the fan To remove and replace the line filterTo remove and replace the fan To remove and replace the optional Gpib and RS-232C cables Seal the shipping container securely, and mark it Fragile Remove accessories from the logic analyzerTo return assemblies Package the logic analyzerReplaceable Parts Direct mail order system Parts listedReplaceable Parts Ordering Parts not listedExploded View Exploded ViewReplaceable Parts List Replaceable Parts ListAgilent Des Part Qty Description Number Replaceable Parts List 1664A Replaceable PartsMP1 RS-232 loopback connector Power Cables and Plug Configurations Power Cables and Plug ConfigurationsTheory of Operation Theory of Operation 1664A Logic Analyzer Block-Level TheoryDisk Drive Controller 1664A TheorySystem Memory CRT Controller and Display RAMCentronix Interface CRT Monitor AssemblyPower Supply External Keyboard InterfaceLogic Acquisition Circuitry Theory of OperationMain Circuit Board Logic Acquisition Theory Probing ComparatorsAcquisition Test and Clock Synchronization Circuit ThresholdPower-up Self-Tests Self-Tests DescriptionROM Test Interrupt Test System Tests System PVSystem Tests System PV RAM TestDisk Test Gpib TestRS-232C Test HIL TestPerform Test All Front Panel TestDisplay Test Chip Tests Analyzer Tests Analy PVAnalyzer Tests Analy PV Board TestData Input Inspection Gpib Optional RS-232COptional RS-232C Signal DefinitionsCentronix Centronix Signal DefinitionsPage Declaration of Conformity Page Document Warranty Product Warranty