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Agilent Technologies 01664-97005 manual To run the self-tests

Models: 01664-97005

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Troubleshooting

To run the self-tests

To run the self-tests

Self-tests identify the correct operation of major functional areas of the instrument. You can run all self-tests without accessing the interior of the instrument. If a self-test fails, the troubleshooting flowcharts instruct you to change a part of the instrument.

1If you just did the power-up self-tests, go to step 2.

If you did not just do the power-up self-tests, disconnect all inputs, insert the operating system disk, then turn on the power switch. Wait until the power-up tests are complete.

2Press the System key, then select the field next to System. Select Test in the pop-up menu and then press the Select key.

3Select the box labeled Load Test System then press the select key. Insert the disk containing the performance verification tests (self-tests) into the disk drive (normally the same as the boot disk).

4Select the box labeled Continue and press the Select key. After the test files have been loaded, and Analy menu is displayed.

You can run all the analyzer tests at one time by selecting All Analyzer Tests. To see more details about each test, you can run each test individually.

5Select the Chip 5 Tests menu and press the Select key.

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Agilent Technologies 01664-97005 manual To run the self-tests, Select the Chip 5 Tests menu and press the Select key

Contents

Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer This Book Table of Contents To test the time interval accuracy To adjust the CRT intensityContents Self-Tests Description Gpib Optional RS-232COptional CentronixViii General Information Accessories Accessories Supplied Part Number QtyAccessories Available Accessories Available Part NumberSpecifications Supplemental Characteristics ProbesState Analysis Timing AnalysisIndicators Measurement and Display FunctionsMeasurement Functions Data Entry/DisplayAuxiliary Power DimensionsMarker Functions Operating EnvironmentProduct Regulations EMCEquipment Required Recommended Test EquipmentRecommended Test Equipment Preparing for Use Check the supplied accessories To inspect the logic analyzerInspect the shipping container for damage Inspect the product for physical damageFerrites FerritesTo apply power To apply powerTo operate the user interface To set the line voltageTo clean the logic analyzer To degauss the displayTo test the logic analyzer To degauss the displayPage Testing Performance Testing Performance To perform the self-tests Select the Front Panel Test To perform the self-testsSelect the Display Test To make the test connectors Materials RequiredTo make the test connectors Set up the equipment To test the threshold accuracyTo test the threshold accuracy Set up the logic analyzerConnect the logic analyzer Test the TTL threshold To test the threshold accuracy Test the ECL threshold Test the − User threshold Test the + User threshold Test the 0 V User threshold Test the next pod To test the glitch capture Set up the pulse generatorPulse Generator Setup To test the glitch capture Set up the oscilloscopeOscilloscope Setup Connect the Logic Analyzer to the Pulse Generator Test the glitch capture on the connected channels Set up the Waveform menu to view all the channels Test the next channels To test the single-clock, single-edge, state acquisition To test the single-clock, single-edge, state acquisition Set up the Format menu Set up the Trigger menuConnect the 1664A Logic Analyzer to the Pulse Generator Verify the test signal To test the single-clock, single-edge, state acquisition Setup/Hold Combinations Check the setup/hold combinationSelect the logic analyzer setup/hold time Select the clock to be tested ClocksTo test the single-clock, single-edge, state acquisition Select the clock to be tested Test the next setup/hold combination To test the multiple-clock, multiple-edge, state acquisition To test the multiple-clock, multiple-edge, state acquisition Set up the Format menu Pod 1, channel Verify the test signal To test the multiple-clock, multiple-edge, state acquisition 0.0 ns 4.5 ns 2.5 ns Select the clocks to be tested To test the multiple-clock, multiple-edge, state acquisition Select the clocks to be tested Hen continue through the complete test Set up the pulse generator according to the following table To test the single-clock, multiple-edge, state acquisitionTo test the single-clock, multiple-edge, state acquisition Set up the Format menu Channel Verify the test signal To test the single-clock, multiple-edge, state acquisition These procedures Logic analyzer Format menu, select Master ClockOscilloscope Timebase Delay Test the next clock To test the time interval accuracy EXT TrigFunction Generator Setup To test the time interval accuracySet up the Format menu Set up the Waveform menu. a Press the Waveform key Acquire the data Performance Test Record Performance Test Record 1664A Logic AnalyzerPerformance Test Record Calibrating and Adjusting Calibrating and Adjusting Logic analyzer calibrationTo adjust the CRT monitor alignment Cause personal injuryTo adjust the CRT monitor alignment Enter the Sys PV tests, then enter the Display TestTo adjust the CRT intensity Press the front panel Select keyTo adjust the CRT intensity Troubleshooting Troubleshooting To use the flowchartsTroubleshooting To use the flowchartsTroubleshooting Troubleshooting Troubleshooting To use the flowcharts To use the flowcharts Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting As the tests complete, check if they pass or fail To check the power-up testsTo check the power-up tests To run the self-tests To run the self-testsSelect the Chip 5 Tests menu and press the Select key To run the self-tests To run the self-tests Select the Front Panel Test To run the self-tests To test the power supply voltages To test the power supply voltagesLoad the +5.00 V supply with a 2 Ω, 25 watt resistor Loaded by the acquisition boardSignals on the Power Supply Cable CRT Monitor Cable Signals To test the CRT monitor signalsTo test the CRT monitor signals To test the keyboard signals Turn off the instrument and remove the power cableTo test the keyboard signals Keyboard Connector SignalsTo test the disk drive voltages To test the disk drive voltagesPin Signal Description Disk Drive VoltagesTo perform the BNC test Press the Config key Assign pods 1 and 2 to MachineTo perform the BNC test To test the logic analyzer probe cables Set up the logic analyzer Configuration menuTo test the logic analyzer probe cables Set up the Format menu. a Press the Format key Select Clear Trigger, then select All Return to the troubleshooting flowchart To test the auxiliary power To test the auxiliary powerReplacing Assemblies Replacing Assemblies Exploded View ListingReplacing Assemblies Reverse this procedure to install the cover To remove and replace the handleTo remove and replace the feet and tilt stand To remove and replace the coverUsing previous procedures, remove the following assemblies Reverse this procedure to install the disk driveTo remove and replace the disk drive To remove and replace the disk driveTo remove and replace the Main Circuit board To remove and replace the power supplyTo remove and replace the power supply To remove and replace the switch actuator assembly To remove and replace the switch actuator assemblyVerify the push-on, push-off action of the assembly To remove and replace the rear panel assembly To remove and replace the rear panel assemblyTo remove and replace the front panel and keyboard To remove and replace the intensity adjustmentTo remove and replace the front panel and keyboard Reverse this procedure to install the handle plate To remove and replace the monitorTo remove and replace the handle plate To remove and replace the monitorTo remove and replace the fan To remove and replace the fanTo remove and replace the line filter To remove and replace the optional Gpib and RS-232C cables Remove accessories from the logic analyzer To return assembliesPackage the logic analyzer Seal the shipping container securely, and mark it FragileReplaceable Parts Parts listed Replaceable Parts OrderingParts not listed Direct mail order systemExploded View Exploded ViewReplaceable Parts List Replaceable Parts ListReplaceable Parts List 1664A Replaceable Parts Agilent Des Part Qty Description NumberMP1 RS-232 loopback connector Power Cables and Plug Configurations Power Cables and Plug ConfigurationsTheory of Operation Theory of Operation Block-Level Theory 1664A Logic Analyzer1664A Theory System MemoryCRT Controller and Display RAM Disk Drive ControllerCRT Monitor Assembly Power SupplyExternal Keyboard Interface Centronix InterfaceTheory of Operation Logic Acquisition CircuitryAcquisition Main Circuit Board Logic Acquisition Theory ProbingComparators Threshold Test and Clock Synchronization CircuitROM Test Power-up Self-TestsSelf-Tests Description System Tests System PV System Tests System PVRAM Test Interrupt TestGpib Test RS-232C TestHIL Test Disk TestDisplay Test Perform Test AllFront Panel Test Analyzer Tests Analy PV Analyzer Tests Analy PVBoard Test Chip TestsData Input Inspection Gpib Optional RS-232C Signal Definitions RS-232COptionalCentronix Signal Definitions CentronixPage Declaration of Conformity 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