Agilent Technologies 01664-97005 manual Verify the test signal

Testing Performance

To test the single-clock, multiple-edge, state acquisition

cPress the Trigger key. Make sure pattern term a is "A". If not, select the field next to "a" under the label Lab1. Type "A" then press the Select key.

Verify the test signal

1Check the clock period. Using the oscilloscope, verify that the clock period is 20 ns, +0 ps or −250 ps.

a In the oscilloscope Timebase menu, select Sweep Speed 4.00 ns/div.

b Select Delay. Using the oscilloscope knob, position the clock waveform (Channel 2) so that a rising edge appears at the left of the display.

c In the oscilloscope Measure menu, select Measure Chan 2, then select +Width. If the positive-going pulse width is more than 20.000 ns, go to step d. If the pulse width is less than or equal to 20.000 ns, go to step 2.

d In the oscilloscope Measure menu, select -Width. If the negative-going pulse width is less than or equal to 20.000 ns but greater than 19.75 ns, go to step 2.

e Decrease the pulse generator Period in 100 ps increments until the oscilloscope Measure +Width or Measure -Width reads less than or equal to 20.000 ns, but greater than 19.75 ns.

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