Test the 0 V User threshold | Agilent Technologies 01664-97005

Testing Performance

To test the threshold accuracy

Test the 0 V User threshold

1Move the cursor to the field to the right of Pod 1. Type 0, then press the Select key.

2On the function generator front panel, enter +0.102 V ±1 mV DC offset. Use the multimeter to verify the voltage.

The activity indicators for pod 1 should show all data channels and the J-clock channel at a logic high.

3Using the Modify down arrow on the function generator, decrease offset voltage in 1-mV increments until all activity indicators for pod 1 show the channels at a logic low. Record the function generator voltage in the performance test record.

4Using the Modify up arrow on the function generator, increase offset voltage in

1-mV increments until all activity indicators for pod 1 show the channels at a logic high. Record the function generator voltage in the performance test record.

3–15

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Agilent Technologies 01664-97005 manual Test the 0 V User threshold

Contents

Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer This Book Table of Contents Contents To adjust the CRT intensityTo test the time interval accuracy Gpib Optional RS-232COptional Centronix Self-Tests Description Viii General Information Accessories Supplied Part Number Qty AccessoriesAccessories Available Accessories Available Part Number Specifications Probes Supplemental CharacteristicsState Analysis Timing Analysis Measurement and Display Functions IndicatorsMeasurement Functions Data Entry/Display Dimensions Auxiliary PowerMarker Functions Operating Environment EMC Product Regulations Recommended Test Equipment Recommended Test EquipmentEquipment Required Preparing for Use To inspect the logic analyzer Check the supplied accessoriesInspect the shipping container for damage Inspect the product for physical damage Ferrites Ferrites To apply power To apply powerTo operate the user interface To set the line voltage To degauss the display To clean the logic analyzerTo test the logic analyzer To degauss the displayPage Testing Performance Testing Performance To perform the self-tests To perform the self-tests Select the Front Panel Test Select the Display Test Materials Required To make the test connectors To make the test connectors To test the threshold accuracy Set up the equipment Connect the logic analyzer Set up the logic analyzerTo test the threshold accuracy Test the TTL threshold To test the threshold accuracy Test the ECL threshold Test the − User threshold Test the + User threshold Test the 0 V User threshold Test the next pod Pulse Generator Setup Set up the pulse generatorTo test the glitch capture Oscilloscope Setup Set up the oscilloscopeTo test the glitch capture Connect the Logic Analyzer to the Pulse Generator Test the glitch capture on the connected channels Set up the Waveform menu to view all the channels Test the next channels To test the single-clock, single-edge, state acquisition To test the single-clock, single-edge, state acquisition Set up the Trigger menu Set up the Format menu Connect the 1664A Logic Analyzer to the Pulse Generator Verify the test signal To test the single-clock, single-edge, state acquisition Select the logic analyzer setup/hold time Check the setup/hold combinationSetup/Hold Combinations Clocks Select the clock to be tested To test the single-clock, single-edge, state acquisition Select the clock to be tested Test the next setup/hold combination To test the multiple-clock, multiple-edge, state acquisition To test the multiple-clock, multiple-edge, state acquisition Set up the Format menu Pod 1, channel Verify the test signal To test the multiple-clock, multiple-edge, state acquisition 0.0 ns 4.5 ns 2.5 ns Select the clocks to be tested To test the multiple-clock, multiple-edge, state acquisition Select the clocks to be tested Hen continue through the complete test To test the single-clock, multiple-edge, state acquisition Set up the pulse generator according to the following table To test the single-clock, multiple-edge, state acquisition Set up the Format menu Channel Verify the test signal To test the single-clock, multiple-edge, state acquisition Logic analyzer Format menu, select Master Clock These procedures Oscilloscope Timebase Delay Test the next clock EXT Trig To test the time interval accuracy To test the time interval accuracy Function Generator Setup Set up the Format menu Set up the Waveform menu. a Press the Waveform key Acquire the data Performance Test Record 1664A Logic Analyzer Performance Test Record Performance Test Record Calibrating and Adjusting Logic analyzer calibration Calibrating and Adjusting Cause personal injury To adjust the CRT monitor alignment Enter the Sys PV tests, then enter the Display Test To adjust the CRT monitor alignment Press the front panel Select key To adjust the CRT intensity To adjust the CRT intensity Troubleshooting To use the flowcharts Troubleshooting To use the flowcharts Troubleshooting Troubleshooting Troubleshooting Troubleshooting To use the flowcharts To use the flowcharts Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting To check the power-up tests To check the power-up testsAs the tests complete, check if they pass or fail Select the Chip 5 Tests menu and press the Select key To run the self-testsTo run the self-tests To run the self-tests To run the self-tests Select the Front Panel Test To run the self-tests To test the power supply voltages To test the power supply voltagesLoad the +5.00 V supply with a 2 Ω, 25 watt resistor Loaded by the acquisition board Signals on the Power Supply Cable To test the CRT monitor signals To test the CRT monitor signalsCRT Monitor Cable Signals Turn off the instrument and remove the power cable To test the keyboard signalsTo test the keyboard signals Keyboard Connector Signals To test the disk drive voltages To test the disk drive voltages Disk Drive Voltages Pin Signal Description To perform the BNC test Press the Config key Assign pods 1 and 2 to MachineTo perform the BNC test To test the logic analyzer probe cables Set up the logic analyzer Configuration menuTo test the logic analyzer probe cables Set up the Format menu. a Press the Format key Select Clear Trigger, then select All Return to the troubleshooting flowchart To test the auxiliary power To test the auxiliary power Replacing Assemblies Replacing Assemblies Listing Exploded View Replacing Assemblies To remove and replace the handle Reverse this procedure to install the coverTo remove and replace the feet and tilt stand To remove and replace the cover Reverse this procedure to install the disk drive Using previous procedures, remove the following assembliesTo remove and replace the disk drive To remove and replace the disk drive To remove and replace the power supply To remove and replace the power supplyTo remove and replace the Main Circuit board Verify the push-on, push-off action of the assembly To remove and replace the switch actuator assemblyTo remove and replace the switch actuator assembly To remove and replace the rear panel assembly To remove and replace the rear panel assembly To remove and replace the front panel and keyboard To remove and replace the intensity adjustmentTo remove and replace the front panel and keyboard To remove and replace the monitor Reverse this procedure to install the handle plateTo remove and replace the handle plate To remove and replace the monitor To remove and replace the line filter To remove and replace the fanTo remove and replace the fan To remove and replace the optional Gpib and RS-232C cables To return assemblies Remove accessories from the logic analyzerPackage the logic analyzer Seal the shipping container securely, and mark it Fragile Replaceable Parts Replaceable Parts Ordering Parts listedParts not listed Direct mail order system Exploded View Exploded View Replaceable Parts List Replaceable Parts List Agilent Des Part Qty Description Number Replaceable Parts List 1664A Replaceable Parts MP1 RS-232 loopback connector Power Cables and Plug Configurations Power Cables and Plug Configurations Theory of Operation Theory of Operation 1664A Logic Analyzer Block-Level Theory System Memory 1664A TheoryCRT Controller and Display RAM Disk Drive Controller Power Supply CRT Monitor AssemblyExternal Keyboard Interface Centronix Interface Logic Acquisition Circuitry Theory of Operation Comparators Main Circuit Board Logic Acquisition Theory ProbingAcquisition Test and Clock Synchronization Circuit Threshold Self-Tests Description Power-up Self-TestsROM Test System Tests System PV System Tests System PVRAM Test Interrupt Test RS-232C Test Gpib TestHIL Test Disk Test Front Panel Test Perform Test AllDisplay Test Analyzer Tests Analy PV Analyzer Tests Analy PVBoard Test Chip Tests Data Input Inspection Gpib Optional RS-232COptional RS-232C Signal Definitions Centronix Centronix Signal DefinitionsPage Declaration of Conformity Page Document Warranty Product Warranty