Testing Performance

To test the multiple-clock, multiple-edge, state acquisition

cPress the Trigger key. Make sure pattern term a is "A". If not, select the field next to "a" under the label Lab1. Type "A" then press the Select key.

Verify the test signal

1Check the clock pulse width. Using the oscilloscope, verify that the clock pulse width is 3.50 ns, +0 ps or 100 ps.

a Enable the pulse generator channel 1 and channel 2 outputs (with the LED off).

b In the oscilloscope Timebase menu, select Delay. Using the oscilloscope knob, position the clock waveform so that the waveform is centered on the screen.

cIn the oscilloscope Delta V menu, set the Marker 1 Position to Chan 2, then set Marker 1 at 1.3000 V. Set the Marker 2 Position to Chan 2, then set Marker 2 at 1.3000 V.

dIn the oscilloscope Delta T menu, select Start On Pos Edge 1. Select Stop On Neg Edge 1.

eIf the pulse width is outside of the limits, adjust the pulse generator channel 2 width and select the oscilloscope Precision Edge Find until the pulse width is within limits.

2Check the clock period. Using the oscilloscope verify that the clock period is 20 ns, +0 ps or 250 ps.

a In the oscilloscope Timebase menu, select Sweep Speed 4.00 ns/div.

b Select Delay. Using the oscilloscope knob, position the clock waveform so that a rising edge appears at the left of the display.

3–38

Page 60
Image 60
Agilent Technologies 01664-97005 manual Verify the test signal