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Agilent Technologies 01664-97005 manual Agilent Technologies 1664A Logic Analyzer

Models: 01664-97005

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Agilent Technologies 1664A Logic Analyzer

The Agilent Technologies 1664A is a 50-MHz State/500-MHz Timing Logic Analyzer.

Features

Some of the main features of the 1664A Logic Analyzer is as follows:

•32 data channels and 2 clock/data channels

•3.5-inch disk drive

•Centronix (parallel) interface (with GPIB and RS-232C interfaces available as options)

•Variable setup/hold time

•4 kbytes deep memory on all channels with 8 kbytes in half channel mode

•Marker measurements

•12 levels of trigger sequencing for state and 10 levels of sequential triggering for timing

•100 MHz time and number-of-states tagging

•Full programmability (with optional interface)

Service Strategy

The service strategy for this instrument is the replacement of defective assemblies. This service guide contains information for finding a defective assembly by testing and servicing the 1664A.

This logic analyzer can be returned to Agilent Technologies for all service work, including troubleshooting. Contact your nearest Agilent Technologies Sales Office for more details.

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Agilent Technologies 01664-97005 manual Agilent Technologies 1664A Logic Analyzer

Contents

Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer This Book Table of Contents To test the time interval accuracy To adjust the CRT intensityContents Self-Tests Description Gpib Optional RS-232COptional CentronixViii General Information Accessories Available AccessoriesAccessories Supplied Part Number Qty Accessories Available Part NumberSpecifications State Analysis Supplemental CharacteristicsProbes Timing AnalysisMeasurement Functions IndicatorsMeasurement and Display Functions Data Entry/DisplayMarker Functions Auxiliary PowerDimensions Operating EnvironmentProduct Regulations EMCEquipment Required Recommended Test EquipmentRecommended Test Equipment Preparing for Use Inspect the shipping container for damage Check the supplied accessoriesTo inspect the logic analyzer Inspect the product for physical damageFerrites FerritesTo operate the user interface To apply powerTo apply power To set the line voltageTo test the logic analyzer To clean the logic analyzerTo degauss the display To degauss the displayPage Testing Performance Testing Performance To perform the self-tests Select the Front Panel Test To perform the self-testsSelect the Display Test To make the test connectors Materials RequiredTo make the test connectors Set up the equipment To test the threshold accuracyTo test the threshold accuracy Set up the logic analyzerConnect the logic analyzer Test the TTL threshold To test the threshold accuracy Test the ECL threshold Test the − User threshold Test the + User threshold Test the 0 V User threshold Test the next pod To test the glitch capture Set up the pulse generatorPulse Generator Setup To test the glitch capture Set up the oscilloscopeOscilloscope Setup Connect the Logic Analyzer to the Pulse Generator Test the glitch capture on the connected channels Set up the Waveform menu to view all the channels Test the next channels To test the single-clock, single-edge, state acquisition To test the single-clock, single-edge, state acquisition Set up the Format menu Set up the Trigger menuConnect the 1664A Logic Analyzer to the Pulse Generator Verify the test signal To test the single-clock, single-edge, state acquisition Setup/Hold Combinations Check the setup/hold combinationSelect the logic analyzer setup/hold time Select the clock to be tested ClocksTo test the single-clock, single-edge, state acquisition Select the clock to be tested Test the next setup/hold combination To test the multiple-clock, multiple-edge, state acquisition To test the multiple-clock, multiple-edge, state acquisition Set up the Format menu Pod 1, channel Verify the test signal To test the multiple-clock, multiple-edge, state acquisition 0.0 ns 4.5 ns 2.5 ns Select the clocks to be tested To test the multiple-clock, multiple-edge, state acquisition Select the clocks to be tested Hen continue through the complete test Set up the pulse generator according to the following table To test the single-clock, multiple-edge, state acquisitionTo test the single-clock, multiple-edge, state acquisition Set up the Format menu Channel Verify the test signal To test the single-clock, multiple-edge, state acquisition These procedures Logic analyzer Format menu, select Master ClockOscilloscope Timebase Delay Test the next clock To test the time interval accuracy EXT TrigFunction Generator Setup To test the time interval accuracySet up the Format menu Set up the Waveform menu. a Press the Waveform key Acquire the data Performance Test Record Performance Test Record 1664A Logic AnalyzerPerformance Test Record Calibrating and Adjusting Calibrating and Adjusting Logic analyzer calibrationTo adjust the CRT monitor alignment Cause personal injuryTo adjust the CRT monitor alignment Enter the Sys PV tests, then enter the Display TestTo adjust the CRT intensity Press the front panel Select keyTo adjust the CRT intensity Troubleshooting Troubleshooting To use the flowchartsTroubleshooting To use the flowchartsTroubleshooting Troubleshooting Troubleshooting To use the flowcharts To use the flowcharts Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting As the tests complete, check if they pass or fail To check the power-up testsTo check the power-up tests To run the self-tests To run the self-testsSelect the Chip 5 Tests menu and press the Select key To run the self-tests To run the self-tests Select the Front Panel Test To run the self-tests Load the +5.00 V supply with a 2 Ω, 25 watt resistor To test the power supply voltagesTo test the power supply voltages Loaded by the acquisition boardSignals on the Power Supply Cable CRT Monitor Cable Signals To test the CRT monitor signalsTo test the CRT monitor signals To test the keyboard signals To test the keyboard signalsTurn off the instrument and remove the power cable Keyboard Connector SignalsTo test the disk drive voltages To test the disk drive voltagesPin Signal Description Disk Drive VoltagesTo perform the BNC test Press the Config key Assign pods 1 and 2 to MachineTo perform the BNC test To test the logic analyzer probe cables Set up the logic analyzer Configuration menuTo test the logic analyzer probe cables Set up the Format menu. a Press the Format key Select Clear Trigger, then select All Return to the troubleshooting flowchart To test the auxiliary power To test the auxiliary powerReplacing Assemblies Replacing Assemblies Exploded View ListingReplacing Assemblies To remove and replace the feet and tilt stand Reverse this procedure to install the coverTo remove and replace the handle To remove and replace the coverTo remove and replace the disk drive Using previous procedures, remove the following assembliesReverse this procedure to install the disk drive To remove and replace the disk driveTo remove and replace the Main Circuit board To remove and replace the power supplyTo remove and replace the power supply To remove and replace the switch actuator assembly To remove and replace the switch actuator assemblyVerify the push-on, push-off action of the assembly To remove and replace the rear panel assembly To remove and replace the rear panel assemblyTo remove and replace the front panel and keyboard To remove and replace the intensity adjustmentTo remove and replace the front panel and keyboard To remove and replace the handle plate Reverse this procedure to install the handle plateTo remove and replace the monitor To remove and replace the monitorTo remove and replace the fan To remove and replace the fanTo remove and replace the line filter To remove and replace the optional Gpib and RS-232C cables Package the logic analyzer Remove accessories from the logic analyzerTo return assemblies Seal the shipping container securely, and mark it FragileReplaceable Parts Parts not listed Parts listedReplaceable Parts Ordering Direct mail order systemExploded View Exploded ViewReplaceable Parts List Replaceable Parts ListReplaceable Parts List 1664A Replaceable Parts Agilent Des Part Qty Description NumberMP1 RS-232 loopback connector Power Cables and Plug Configurations Power Cables and Plug ConfigurationsTheory of Operation Theory of Operation Block-Level Theory 1664A Logic AnalyzerCRT Controller and Display RAM 1664A TheorySystem Memory Disk Drive ControllerExternal Keyboard Interface CRT Monitor AssemblyPower Supply Centronix InterfaceTheory of Operation Logic Acquisition CircuitryAcquisition Main Circuit Board Logic Acquisition Theory ProbingComparators Threshold Test and Clock Synchronization CircuitROM Test Power-up Self-TestsSelf-Tests Description RAM Test System Tests System PVSystem Tests System PV Interrupt TestHIL Test Gpib TestRS-232C Test Disk TestDisplay Test Perform Test AllFront Panel Test Board Test Analyzer Tests Analy PVAnalyzer Tests Analy PV Chip TestsData Input Inspection Gpib Optional RS-232C Signal Definitions RS-232COptionalCentronix Signal Definitions CentronixPage Declaration of Conformity Page Document Warranty Product Warranty