Agilent Technologies 01664-97005 To test the multiple-clock, multiple-edge, state acquisition

To test the multiple-clock, multiple-edge, state acquisition

Testing the multiple-clock, multiple-edge, state acquisition verifies the performance of the following specifications:

•Minimum master to master clock time.

•Maximum state acquisition speed.

•Setup/Hold time for multiple-clock, multiple-edge, state acquisition.

•Minimum clock pulse width.

This test checks data using multiple clocks at three selected setup/hold times.

Equipment Required

Equipment	Critical Specifications	Recommended
		Model/Part
Pulse Generator	100 MHz 3.5 ns pulse width, < 600 ps rise time	Agilent 8131A option 020
Digitizing Oscilloscope	≥ 6 GHz bandwidth, < 58 ps rise time	Agilent 54121T
Adapter	SMA(m)-BNC(f)	Agilent 1250-1200
SMA Coax Cable (Qty 3)	18 GHz bandwidth	Agilent 8120-4948
BNC Cable	BNC(m)(m) 48 in. >2 GHz bandwidth	Agilent 8120-1840
Coupler	BNC(m)(m)	Agilent 1250-0216
BNC Test Connector,
6x2 (Qty 4)

Set up the equipment

1Turn on the equipment required and the logic analyzer. Let them warm up for 30 minutes before beginning the test if you have not already done so.

2Set up the pulse generator.

a Set up the pulse generator according to the following table.

Pulse Generator Setup

Channel 1	Channel 2	Period
Delay: 0 ps	Doub: 20.0 ns	40 ns
Width: 4.5 ns	Width: 3.5 ns
High: −0.9 V	High: −0.9 V
Low: −1.7 V	Low: −1.7 V

bDisable the pulse generator channel 2 COMP (with the LED off).

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