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Agilent Technologies
01664-97005
- page 17
1
17
164
164
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164 pages, 1.97 Mb
2
To inspect the logic analyzer 2-2
Ferrites 2-3
To apply power 2-4
To operate the user interface 2-4
To set the line voltage 2-4
To degauss the display 2-5
To clean the logic analyzer 2-5
To test the logic analyzer 2-5
Preparing for Use
Contents
Main
Agilent Technologies 1664A Logic Analyzer
Page
In This Book
Table of Contents
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General Information
Accessories
Specifications
Characteristics
Supplemental Characteristics
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Recommended Test Equipment
Equipment Required
18
General Information Recommended Test Equipment
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Preparing For Use
Power Requirements
Operating Environment
Storage
Ferrites
To apply power
To operate the user interface
To set the line voltage
To degauss the display
To clean the logic analyzer
To test the logic analyzer
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Page
Testing Performance
The Logic Analyzer Interface
Test Strategy
Test Interval
Performance Test Record
To perform the self-tests
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To make the test connectors
The test connectors connect the logic analyzer to the test equipment.
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To test the threshold accuracy
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Test the TTL threshold
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Test the ECL threshold
Test the User threshold
Test the + User threshold
Test the 0 V User threshold
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To test the glitch capture
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Connect the Logic Analyzer to the Pulse Generator
Testing Performance To test the glitch capture
319
Test the glitch capture on the connected channels
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Test the next channels
To test the single-clock, single-edge, state acquisition
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width is 3.50 ns, +0 ps or 100 ps.
+0 ps or 250 ps.
is 3.50 ns, +0 ps or 100 ps.
Check the setup/hold combination
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according to the setup/hold combination selected, +0.0 ps or 100 ps.
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To test the multiple-clock, multiple-edge, state acquisition
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is 4.450 ns, +50 ps or 100 ps.
Check the setup/hold with single clock edges, multiple clocks
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To test the single-clock, multiple-edge, state acquisition
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+0 ps or 250 ps.
is 4.000 ns, +0 ps or 100 ps.
Check the setup/hold combination
according to the setup time of the setup/hold combination selected, +0.0 ps or -100.0 ps.
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To test the time interval accuracy
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Acquire the data
Performance Test Record
359
Performance Test Record (continued)
360
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Calibrating and Adjusting
To adjust the CRT monitor alignment
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To adjust the CRT intensity
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Troubleshooting
To use the flowcharts
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To check the power-up tests
turning on the power switch.
To run the self-tests
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To test the power supply voltages
table.
To test the CRT monitor signals
To test the keyboard signals
To test the disk drive voltages
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To perform the BNC test
To test the logic analyzer probe cables
logic analyzer.
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Page
To test the auxiliary power
6
Replacing Assemblies
Replacing Assemblies
Replacement Strategy
Tools Required
Exploded View
Listing
63
Replacing Assemblies
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To remove and replace the handle
To remove and replace the feet and tilt stand
To remove and replace the cover
To remove and replace the disk drive
To remove and replace the power supply
To remove and replace the Main Circuit board
To remove and replace the switch actuator assembly
the off position.
To remove and replace the rear panel assembly
To remove and replace the front panel and keyboard
To remove and replace the intensity adjustment
To remove and replace the monitor
To remove and replace the handle plate
To remove and replace the fan
To remove and replace the line filter
To remove and replace the optional GPIB and RS-232C cables
To return assemblies
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Replaceable Parts
Replaceable Parts Ordering
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Replaceable Parts List
75
76
77
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Self-Tests Description
Power-up Self-Tests
System Tests (System PV)
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Analyzer Tests (Analy PV)
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GPIB (Optional)
RS-232C(Optional)
816
RS-232C Signal Definitions
Centronix
817
Centronix Signal Definitions
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DECLARATION OF CONFORMITY