Testing Performance | Agilent Technologies 01664-97005 specs

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To perform the self-tests 3-3 To make the test connectors 3-6 To test the threshold accuracy 3-8 To test the glitch capture 3-17

To test the single-clock, single-edge, state acquisition 3-23

To test the multiple-clock, multiple-edge, state acquisition 3-34 To test the single-clock, multiple-edge, state acquisition 3-45 To test the time interval accuracy 3-54

Performance Test Record 3-59

Testing Performance

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Agilent Technologies 01664-97005 manual Testing Performance

Contents

Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer Agilent Technologies 1664A Logic Analyzer This Book Table of Contents To test the time interval accuracy To adjust the CRT intensityContents Gpib Optional RS-232COptional Centronix Self-Tests Description Viii General Information Accessories Available Part Number AccessoriesAccessories Supplied Part Number Qty Accessories Available Specifications Timing Analysis Supplemental CharacteristicsProbes State Analysis Data Entry/Display IndicatorsMeasurement and Display Functions Measurement Functions Operating Environment Auxiliary PowerDimensions Marker Functions EMC Product Regulations Equipment Required Recommended Test EquipmentRecommended Test Equipment Preparing for Use Inspect the product for physical damage Check the supplied accessoriesTo inspect the logic analyzer Inspect the shipping container for damage Ferrites Ferrites To set the line voltage To apply powerTo apply power To operate the user interface To degauss the display To clean the logic analyzerTo degauss the display To test the logic analyzerPage Testing Performance Testing Performance To perform the self-tests To perform the self-tests Select the Front Panel Test Select the Display Test Materials Required To make the test connectors To make the test connectors To test the threshold accuracy Set up the equipment To test the threshold accuracy Set up the logic analyzerConnect the logic analyzer Test the TTL threshold To test the threshold accuracy Test the ECL threshold Test the − User threshold Test the + User threshold Test the 0 V User threshold Test the next pod To test the glitch capture Set up the pulse generatorPulse Generator Setup To test the glitch capture Set up the oscilloscopeOscilloscope Setup Connect the Logic Analyzer to the Pulse Generator Test the glitch capture on the connected channels Set up the Waveform menu to view all the channels Test the next channels To test the single-clock, single-edge, state acquisition To test the single-clock, single-edge, state acquisition Set up the Trigger menu Set up the Format menu Connect the 1664A Logic Analyzer to the Pulse Generator Verify the test signal To test the single-clock, single-edge, state acquisition Setup/Hold Combinations Check the setup/hold combinationSelect the logic analyzer setup/hold time Clocks Select the clock to be tested To test the single-clock, single-edge, state acquisition Select the clock to be tested Test the next setup/hold combination To test the multiple-clock, multiple-edge, state acquisition To test the multiple-clock, multiple-edge, state acquisition Set up the Format menu Pod 1, channel Verify the test signal To test the multiple-clock, multiple-edge, state acquisition 0.0 ns 4.5 ns 2.5 ns Select the clocks to be tested To test the multiple-clock, multiple-edge, state acquisition Select the clocks to be tested Hen continue through the complete test To test the single-clock, multiple-edge, state acquisition Set up the pulse generator according to the following table To test the single-clock, multiple-edge, state acquisition Set up the Format menu Channel Verify the test signal To test the single-clock, multiple-edge, state acquisition Logic analyzer Format menu, select Master Clock These procedures Oscilloscope Timebase Delay Test the next clock EXT Trig To test the time interval accuracy To test the time interval accuracy Function Generator Setup Set up the Format menu Set up the Waveform menu. a Press the Waveform key Acquire the data Performance Test Record 1664A Logic Analyzer Performance Test Record Performance Test Record Calibrating and Adjusting Logic analyzer calibration Calibrating and Adjusting Cause personal injury To adjust the CRT monitor alignment Enter the Sys PV tests, then enter the Display Test To adjust the CRT monitor alignment Press the front panel Select key To adjust the CRT intensity To adjust the CRT intensity Troubleshooting To use the flowcharts Troubleshooting To use the flowcharts Troubleshooting Troubleshooting Troubleshooting Troubleshooting To use the flowcharts To use the flowcharts Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting Troubleshooting As the tests complete, check if they pass or fail To check the power-up testsTo check the power-up tests To run the self-tests To run the self-testsSelect the Chip 5 Tests menu and press the Select key To run the self-tests To run the self-tests Select the Front Panel Test To run the self-tests Loaded by the acquisition board To test the power supply voltagesTo test the power supply voltages Load the +5.00 V supply with a 2 Ω, 25 watt resistor Signals on the Power Supply Cable CRT Monitor Cable Signals To test the CRT monitor signalsTo test the CRT monitor signals Keyboard Connector Signals To test the keyboard signalsTurn off the instrument and remove the power cable To test the keyboard signals To test the disk drive voltages To test the disk drive voltages Disk Drive Voltages Pin Signal Description To perform the BNC test Press the Config key Assign pods 1 and 2 to MachineTo perform the BNC test To test the logic analyzer probe cables Set up the logic analyzer Configuration menuTo test the logic analyzer probe cables Set up the Format menu. a Press the Format key Select Clear Trigger, then select All Return to the troubleshooting flowchart To test the auxiliary power To test the auxiliary power Replacing Assemblies Replacing Assemblies Listing Exploded View Replacing Assemblies To remove and replace the cover Reverse this procedure to install the coverTo remove and replace the handle To remove and replace the feet and tilt stand To remove and replace the disk drive Using previous procedures, remove the following assembliesReverse this procedure to install the disk drive To remove and replace the disk drive To remove and replace the Main Circuit board To remove and replace the power supplyTo remove and replace the power supply To remove and replace the switch actuator assembly To remove and replace the switch actuator assemblyVerify the push-on, push-off action of the assembly To remove and replace the rear panel assembly To remove and replace the rear panel assembly To remove and replace the front panel and keyboard To remove and replace the intensity adjustmentTo remove and replace the front panel and keyboard To remove and replace the monitor Reverse this procedure to install the handle plateTo remove and replace the monitor To remove and replace the handle plate To remove and replace the fan To remove and replace the fanTo remove and replace the line filter To remove and replace the optional Gpib and RS-232C cables Seal the shipping container securely, and mark it Fragile Remove accessories from the logic analyzerTo return assemblies Package the logic analyzer Replaceable Parts Direct mail order system Parts listedReplaceable Parts Ordering Parts not listed Exploded View Exploded View Replaceable Parts List Replaceable Parts List Agilent Des Part Qty Description Number Replaceable Parts List 1664A Replaceable Parts MP1 RS-232 loopback connector Power Cables and Plug Configurations Power Cables and Plug Configurations Theory of Operation Theory of Operation 1664A Logic Analyzer Block-Level Theory Disk Drive Controller 1664A TheorySystem Memory CRT Controller and Display RAM Centronix Interface CRT Monitor AssemblyPower Supply External Keyboard Interface Logic Acquisition Circuitry Theory of Operation Acquisition Main Circuit Board Logic Acquisition Theory ProbingComparators Test and Clock Synchronization Circuit Threshold ROM Test Power-up Self-TestsSelf-Tests Description Interrupt Test System Tests System PVSystem Tests System PV RAM Test Disk Test Gpib TestRS-232C Test HIL Test Display Test Perform Test AllFront Panel Test Chip Tests Analyzer Tests Analy PVAnalyzer Tests Analy PV Board Test Data Input Inspection Gpib Optional RS-232COptional RS-232C Signal Definitions Centronix Centronix Signal DefinitionsPage Declaration of Conformity Page Document Warranty Product Warranty