SM320F2812-HT

www.ti.com

 

 

 

 

SGUS062A –JUNE 2009 –REVISED APRIL 2010

 

Table 6-51. Simultaneous Sampling Mode Timing (1)

(continued)

 

 

 

 

 

 

AT 25-MHz ADC

 

 

 

SAMPLE n

SAMPLE n + 1

 

CLOCK,

REMARKS

 

 

 

 

tc(ADCCLK) = 40 ns

 

 

Delay time for successive

 

(3 + Acqps) ×

 

 

 

td(schB0_n+1)

results to appear in Result

 

 

120 ns

 

 

tc(ADCCLK)

 

 

 

register

 

 

 

 

6.29.8 Definitions of Specifications and Terminology

6.29.8.1 Integral Nonlinearity

Integral nonlinearity refers to the deviation of each individual code from a line drawn from zero through full scale. The point used as zero occurs 1/2 LSB before the first code transition. The full-scale point is defined as level 1/2 LSB beyond the last code transition. The deviation is measured from the center of each particular code to the true straight line between these two points.

6.29.8.2 Differential Nonlinearity

An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal value. A differential nonlinearity error of less than ±1 LSB ensures no missing codes.

6.29.8.3 Zero Offset

The major carry transition should occur when the analog input is at zero volts. Zero error is defined as the deviation of the actual transition from that point.

6.29.8.4 Gain Error

The first code transition should occur at an analog value 1/2 LSB above negative full scale. The last transition should occur at an analog value 1 1/2 LSB below the nominal full scale. Gain error is the deviation of the actual difference between first and last code transitions and the ideal difference between first and last code transitions.

6.29.8.5 Signal-to-Noise Ratio + Distortion (SINAD)

SINAD is the ratio of the rms value of the measured input signal to the rms sum of all other spectral components below the Nyquist frequency, including harmonics but excluding dc. The value for SINAD is expressed in decibels.

6.29.8.6 Effective Number of Bits (ENOB)

For a sine wave, SINAD can be expressed in terms of the number of bits. Using the following formula,

N =

(SINAD 1.76)

6.02

it is possible to get a measure of performance expressed as N, the effective number of bits. Thus, effective number of bits for a device for sine wave inputs at a given input frequency can be calculated directly from its measured SINAD.

6.29.8.7 Total Harmonic Distortion (THD)

THD is the ratio of the rms sum of the first six harmonic components to the rms value of the measured input signal and is expressed as a percentage or in decibels.

6.29.8.8 Spurious Free Dynamic Range (SFDR)

SFDR is the difference in dB between the rms amplitude of the input signal and the peak spurious signal.

Copyright © 2009–2010, Texas Instruments Incorporated

Electrical Specifications

141

 

Submit Documentation Feedback

 

Product Folder Link(s): SM320F2812-HT

Page 141
Image 141
Texas Instruments SM320F2812-HT specifications Definitions of Specifications and Terminology

SM320F2812-HT specifications

The Texas Instruments SM320F2812-HT is a highly capable digital signal processor (DSP) specifically designed for high-performance and real-time applications in harsh environments. This part of the C2000 family of microcontrollers caters to applications in areas such as industrial automation, motor control, and power conversion, where reliability and durability under extreme temperature conditions are paramount.

One of the standout features of the SM320F2812-HT is its robust architecture based on a 32-bit fixed-point core. This allows for efficient execution of complex algorithms while maintaining a high processing speed. The processor operates at clock speeds of up to 150 MHz, enabling it to handle multiple tasks simultaneously with minimal latency.

The SM320F2812-HT boasts an impressive memory configuration that includes up to 128 KB of flash memory and 4 KB of RAM. The integrated memory supports efficient data handling and storage, making it ideal for demanding applications that require quick access to critical information. The device also features various peripherals, including analog-to-digital converters (ADCs), pulse width modulation (PWM) modules, and serial communication interfaces, which enhance its functionality in real-time processing and control tasks.

Furthermore, this DSP employs advanced control algorithms and supports various communication protocols, allowing it to interoperate seamlessly with other devices within a system. Its capabilities are further enhanced by Texas Instruments’ extensive development tools and software libraries, which enable developers to accelerate design cycles and improve overall efficiency.

With its high temperature rating, the SM320F2812-HT is designed to operate within a temperature range from -40°C to 125°C, making it particularly well-suited for use in automotive, aerospace, and other rugged environments where traditional components might fail. The high reliability and endurance of this microcontroller make it a preferred choice among engineers looking for durable solutions without compromising performance.

In summary, the Texas Instruments SM320F2812-HT represents a powerful blend of processing capabilities, memory architecture, and environmental resilience. Its features make it a go-to option for developers in search of a robust DSP for real-time applications, ensuring that it meets the rigorous demands of various industrial sectors while delivering consistent performance.