Table 11-3. TAM Tests versus Test Connectors (continued)
Connector
A15J200
A15J400
A155502
A15J602
A15J901
Manual Probe Troubleshooting Test
Positive 15 volt supply
Sampler drive buffer bias
Sampling oscillator bias
Offset lock drive buffer
OFL error voltage
Negative 10 volt supply
Offset lock loop BW DAC
Positive 15 volt supply
Offset lock RF buffer
IF AMP/limiter bias
Offset lock loop buffer D
Offset lock loop buffer C
Sampler bias test
Positive 15 volt supply
Third LO tune voltage
Offset lock loop buffer
600 MHz oscillator bias
Calibrator AGC amp bias
Calibrator
amp1
adj
3rd LO driver amp
Positive 15 volt supply
Flatness compensation 3
Flatness compensation 2
Flatness compensation 1
SIG ID collector bias
RF gain control test
Revision
External mixer switch
signal
ID switch
Ten volt reference
External mixer bias
Measured Signal Liner
MS1
MS2
MS3
MS4
MS6
MS8
MS5,MS7,MS8
MS2
MS4
MS6
MS7
MS8
MS3
MS2
MS3
MS4
MS5
MS6
MS7
MSl,
MS8
MS8
MS2
MS5
MS6
MS7
MSl,
MS3
MS3
MSl,
MS8
MS5, MS6
MS4
MS7
Synthesizer Section 11-7