Table 11-3. TAM Tests versus Test Connectors (continued)

 

Connector

Manual Probe Troubleshooting Test

 

A15J200

Positive 15 volt supply

 

 

Sampler

drive buffer bias

 

 

Sampling oscillator bias

 

 

Offset

lock

drive buffer

 

 

OFL

error

voltage

 

 

 

Negative

10 volt supply

 

 

Offset lock loop BW DAC

 

A15J400

Positive 15 volt supply

 

 

Offset

lock

RF

buffer

 

 

 

IF AMP/limiter

bias

 

 

 

Offset lock loop buffer D

 

 

Offset lock loop buffer C

 

 

Sampler

bias test

 

 

A155502

Positive 15 volt supply

 

 

Third

LO

tune

voltage

 

 

Offset

lock

loop

buffer

 

 

600

MHz oscillator bias

 

 

Calibrator

AGC

amp

bias

 

 

Calibrator

amp1

adj

 

 

 

3rd

LO

driver amp

 

 

A15J602

Positive 15 volt supply

 

 

Flatness

compensation

3

 

 

Flatness

compensation

2

 

 

Flatness

compensation

1

 

 

SIG

ID

collector bias

 

 

 

RF

gain

control

test

 

 

A15J901

Revision

 

 

 

 

 

 

External

mixer

switch

 

 

 

signal

ID switch

 

 

 

Ten

volt

reference

 

 

 

External

mixer

bias

 

Measured Signal Liner

MS1

MS2

MS3

MS4

MS6

MS8

MS5,MS7,MS8

MS2

MS4

MS6

MS7

MS8

MS3

MS2

MS3

MS4

MS5

MS6

MS7

MSl, MS8

MS8

MS2

MS5

MS6

MS7

MSl, MS3

MS3

MSl, MS8

MS5, MS6

MS4

MS7

Synthesizer Section 11-7

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Agilent Technologies 856290216 service manual Ofl, Agc, MS1 MS2 MS3 MS4 MS6 MS8 MS5,MS7,MS8, MS8 MS2 MS5 MS6 MS7, MS4 MS7